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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, DC, CPSY, RECONF, CPM, ICD, IE (Joint) [detail] |
2016-11-30 09:00 |
Osaka |
Ritsumeikan University, Osaka Ibaraki Campus |
Fast Test Pattern Reordering Based on Weighted Fault Coverage Shingo Inuyama, Kazuhiko Iwasaki (Tokyo Metropolitan Univ.), Masayuki Arai (Nihon Univ.) VLD2016-61 DC2016-55 |
Shrinking feature size and higher integration on semiconductor device manufacturing technology bring a problem of the ga... [more] |
VLD2016-61 DC2016-55 pp.99-104 |
DC |
2015-06-16 14:35 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Study on Fast Bridge Fault Test Generation Based on Critical Area Masayuki Arai (Nihon Univ.), Shingo Inuyama, Kazuhiko Iwasaki (Tokyo Metro. Univ.) DC2015-17 |
[more] |
DC2015-17 pp.7-12 |
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