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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
HWS, VLD [detail] |
2020-03-04 13:50 |
Okinawa |
Okinawa Ken Seinen Kaikan (Cancelled but technical report was issued) |
Standard Cell Library of Stack Structured Cells to Reduce LSI Maximum Power Consumption Yuki Imai (Saitama Univ.), Shinichi Nishizawa (Fukuoka Univ.), Kazuhito Ito (Saitama Univ.) VLD2019-101 HWS2019-74 |
Energy harvesting elements such as solar cells used as power sources for IoT devices have large internal resistance, and... [more] |
VLD2019-101 HWS2019-74 pp.43-48 |
HWS, VLD [detail] |
2020-03-04 14:30 |
Okinawa |
Okinawa Ken Seinen Kaikan (Cancelled but technical report was issued) |
Estimation method of process variation using an IDDQ test and retention characteristics of flip-flop Shinichi Nishizawa (Fukuoka Univ.), Kazuhito (Saitama Univ.) VLD2019-102 HWS2019-75 |
[more] |
VLD2019-102 HWS2019-75 pp.49-52 |
VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2019-11-14 09:15 |
Ehime |
Ehime Prefecture Gender Equality Center |
NBTI Model Replicating AC Stress/Recovery from a Single-shot Long-term DC Measurement Takumi Hosaka (Saitama Univ.), Shinichi Nishizawa (Fukuoka Univ.), RYO Kishida (Tokyo Univ. of Science), Takashi Matsumoto (The Univ. of Tokyo), Kazutoshi Kobayashi (Kyoto Institute of Tech.) VLD2019-35 DC2019-59 |
In this paper, simple and compact Negative Bias Temperature Instability (NBTI) model is proposed. The model is based on ... [more] |
VLD2019-35 DC2019-59 pp.57-62 |
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2018-12-07 09:25 |
Hiroshima |
Satellite Campus Hiroshima |
Flip-Flops with different retention characteristics for process variation estimation Kento Fukazawa, Shinichi Nishizawa, Kazuhito Ito (Saitama Univ.) VLD2018-66 DC2018-52 |
This paper proposes to use multiple D-Flip-Flops having different retention characteristics with Ring Oscillator to moni... [more] |
VLD2018-66 DC2018-52 pp.189-193 |
SDM |
2017-06-20 15:15 |
Tokyo |
Campus Innovation Center Tokyo |
Capacitance Analyses of p-ch GaN MOS Structure on Polarization ― Junction Substrate Rumi Takayama, Takuya Hoshii (Tokyo Inst. of Tech.), Akira Nakajima (AIST), Shinichi Nishizawa (Kyushu Univ.), Hiromichi Ohashi, Kuniyuki Kakushima, Hitoshi Wakabayashi, Kazuo Tsutsui (Tokyo Inst. of Tech.) SDM2017-27 |
[more] |
SDM2017-27 pp.31-34 |
RECONF, CPSY, VLD, IPSJ-SLDM [detail] |
2015-01-29 17:40 |
Kanagawa |
Hiyoshi Campus, Keio University |
Analyzing the Impacts of Simultaneous Supply and Threshold Voltage Tuning on Energy Dissipation in VLSI Circuits Toshihiro Takeshita, Shinichi Nishizawa, AKM Mahfuzul Islam, Tohru Ishihara, Hidetoshi Onodera (Kyoto Univ) VLD2014-129 CPSY2014-138 RECONF2014-62 |
Simultaneous supply and threshold voltage tuning has a strong impact on the energy reduction of LSI circuits. Therefore,... [more] |
VLD2014-129 CPSY2014-138 RECONF2014-62 pp.111-116 |
ITE-BCT, IPSJ-AVM, CS, IE [detail] |
2012-12-06 10:00 |
Fukui |
Fukuisi-chiiki-kouryu-plaza |
The live feed over the mobile network in NOTTV programs Yasuhiko Hayashi, Shinichi nishizawa, Tomoyuki Ohya (mmbi) |
[more] |
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VLD |
2009-03-13 10:05 |
Okinawa |
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A Study for Power Grid Simulator by using GPU Hisako Sugano, Shinichi Nishizawa, Taiki Hashizume, Masahiro Fukui (Ritsumeikan Univ.) VLD2008-158 |
The rapidity of technical innovation of GPU is much faster than CPU and above Moore’s law. Recently, there are some exam... [more] |
VLD2008-158 pp.189-194 |
VLD, ICD |
2008-03-06 11:35 |
Okinawa |
TiRuRu |
A Study for Implementation of High Speed Circuit Simulator by using FPGA Taiki Hashizume, Seiji Minoura, Tadashi Mizutani, Hironobu Ishijima, Shinichi Nishizawa (Ritsumeikan Univ.), Masaya Yoshikawa (Meijo Univ.), Masahiro Fukui (Ritsumeikan Univ.) VLD2007-149 ICD2007-172 |
With recent advanced technology, simulation plays an important role in the design flow. However, the simulation requires... [more] |
VLD2007-149 ICD2007-172 pp.31-36 |
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