IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 8 of 8  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
IT, ISEC, WBS 2013-03-07
13:40
Osaka Kwansei Gakuin Univ., Osaka-Umeda Campus Side Channel Security Evaluation of AES Software Implementation by Chosen-Input Method
Shohei Saito, Takeshi Kishikawa, Tsutomu Matsumoto (Yokohama National Univ.) IT2012-73 ISEC2012-91 WBS2012-59
 [more] IT2012-73 ISEC2012-91 WBS2012-59
pp.71-78
IT, ISEC, WBS 2013-03-07
14:30
Osaka Kwansei Gakuin Univ., Osaka-Umeda Campus Impact of High-Speed Photodetector on Side Channel Attack through LED Pilot Lamp
Shohei Saito, Tsutomu Matsumoto (Yokohama National Univ.) IT2012-75 ISEC2012-93 WBS2012-61
 [more] IT2012-75 ISEC2012-93 WBS2012-61
pp.87-94
IT, ISEC, WBS 2013-03-08
10:30
Osaka Kwansei Gakuin Univ., Osaka-Umeda Campus Laser Fault Injection Attack on Non-Decapped Contact Smart Card
Hitoshi Ono, Yuu Tsuchiya, Tsuyoshi Toyama, Takeshi Kishikawa, Shohei Saito (Yokohama National Univ.), Akihiko Sasaki (MORITA TECH), Akashi Satoh (Univ. of Tokyo), Tsutomu Matsumoto (Yokohama National Univ.) IT2012-93 ISEC2012-111 WBS2012-79
 [more] IT2012-93 ISEC2012-111 WBS2012-79
pp.195-202
ISEC 2012-12-12
14:55
Tokyo Kikai-Shinko-Kaikan Bldg. The YNU's Method for Acquiring Power-Consumption Traces Developed for DPA Contest v3
Tsutomu Matsumoto, Takeshi Kishikawa, Hitoshi Ono, Shohei Saito, Yuu Tsuchiya (Yokohama Nat'l Univ.), Akihiko Sasaki (MORITA TECH), Tsuyoshi Toyama (Yokohama Nat'l Univ.) ISEC2012-76
 [more] ISEC2012-76
pp.29-36
ISEC, LOIS 2012-11-21
14:15
Shizuoka Shizuoka City Industry-University Exchange Center How to Extract AES Key from Smart Card by Fault Injection Attack Using Electromaginetic Irradiataion
Yuu Tsuchiya, Takeshi Kishikawa, Shohei Saito, Tsuyoshi Toyama (YNU), Akihiko Sasaki (MORITA TECH), Akashi Satoh (VDEC, Univ. Tokyo), Tsutomu Matsumoto (YNU) ISEC2012-57 LOIS2012-32
Fault injection attack, inducing partial fault in a cryptographic module and extracting the inside key, has been conside... [more] ISEC2012-57 LOIS2012-32
pp.1-8
ISEC 2012-09-21
16:15
Tokyo Kikai-Shinko-Kaikan Bldg. Pilot Lamps can Serve as Side Channels
Shohei Saito, Tsutomu Matsumoto (Yokohama Nat'l Univ.) ISEC2012-54
Measuring microscopic variation of physical quantity such as power consumption or electromagnetic emanation of cryptogra... [more] ISEC2012-54
pp.51-58
ISEC 2012-09-21
17:05
Tokyo Kikai-Shinko-Kaikan Bldg. An Efficient Method of Strictly Evaluating Side-Channel Security
Takeshi Kishikawa, Shohei Saito, Yuu Tsuchiya, Tsuyoshi Toyama, Tsutomu Matsumoto (Yokohama Nat'l Univ.) ISEC2012-56
Evaluation of side-channel security, i.e., resistance against side-channel attacks of cryptographic modules is definitel... [more] ISEC2012-56
pp.67-74
ISEC 2011-09-09
14:25
Tokyo Kikai-Shinko-Kaikan Bldg. Can Pilot Lamps Serve as Side Channels?
Tsutomu Matsumoto, Shohei Saito (YNU) ISEC2011-28
Measuring microscopic variation of power consumption or electromagnetic emanation of cryptographic hardware may be utili... [more] ISEC2011-28
pp.9-16
 Results 1 - 8 of 8  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan