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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM, ICD, ITE-IST [detail] 2018-08-08
09:45
Hokkaido Hokkaido Univ., Graduate School of IST M Bldg., M151 Understanding Temperature Effect on Subthreshold Slope Variability in Bulk and SOTB MOSFETs
Shuang Gao, Tomoko Mizutani, Kiyoshi Takeuchi, Masaharu Kobayashi, Toshiro Hiramoto (Univ. Tokyo) SDM2018-37 ICD2018-24
We present a new finding that subthreshold slope (SS) variability is reduced at high temperature in both bulk and silico... [more] SDM2018-37 ICD2018-24
pp.65-70
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