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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 22  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
AP 2024-03-15
10:25
Fukui UNIVERSITY OF FUKUI
(Primary: On-site, Secondary: Online)
A Study on Path loss characteristics estimation methods considering geographical conditions for designing narrowband DR-IoT communication system
Takato Ikegame, Naoki Ikeda, Motonari Imai, Tetsushi Ikegami (Meiji Univ.), Mineo Takai (Osaka Univ.), Susumu Ishihara (Shizuoka Univ.), Arata Kato, Shugo Kajita (STE)
(To be available after the conference date) [more]
MIKA
(3rd)
2023-10-11
14:30
Okinawa Okinawa Jichikaikan
(Primary: On-site, Secondary: Online)
[Poster Presentation] Field experiments on VHF-High band for design of a quasi-narrow band wireless communication system DR-IoT -- Path loss characteristics estimation methods considering geographical conditions --
Takato Ikegame, Naoki Ikeda, Motonari Imai, Tetsushi Ikegami (Meiji Univ.), Mineo Takai (Osaka Univ.), Susumu Ishihara (Shizuoka Univ.), Arata Kato, Shugo Kajita (STE)
In the VHF-High band (207.5 MHz to 222 MHz), research is being conducted on a disaster-response narrowband wireless syst... [more]
EMM, BioX, ISEC, SITE, ICSS, HWS, IPSJ-CSEC, IPSJ-SPT [detail] 2023-07-25
10:20
Hokkaido Hokkaido Jichiro Kaikan
Takayuki Kondo, Taiki Kitazawa, Shugo Kaji, Daisuke Fujimoto, Yuichi Hayashi (NAIST) ISEC2023-40 SITE2023-34 BioX2023-43 HWS2023-40 ICSS2023-37 EMM2023-40
(To be available after the conference date) [more] ISEC2023-40 SITE2023-34 BioX2023-43 HWS2023-40 ICSS2023-37 EMM2023-40
pp.171-175
SeMI, SeMI
(Joint)
2023-01-20
10:30
Tokushima Naruto grand hotel
(Primary: On-site, Secondary: Online)
Design of the basic architecture of a quasi-narrow band wireless communication system, DR-IoT
Susumu Ishihara, Shinka Asano, Ryosuke Umemoto (Shizuoka Univ.), Arata Kato, Shugo Kajita (スペースタイムエンジニアリング), Hiroshi Yamamoto (Ritsumeikan Univ.), Tetsushi Ikegami (Meiji Univ.), Mineo Takai (Osaka Univ.) SeMI2022-97
We have proposed DR-IoT (Diversified-Range/Disaster-Response IoT), a VHF-band wireless communication system using small ... [more] SeMI2022-97
pp.119-124
EMCJ, MW, EST, IEE-EMC [detail] 2022-10-14
09:50
Akita Akita University
(Primary: On-site, Secondary: Online)
Development of an Evaluation System for Modeling of Information Leakage Induced by Low-Power IEMI
Seiya Takano, Shugo Kaji (NAIST), Masahiro Kinugawa (Univ. of Fukuchiyama), Daisuke Fujimoto, Yuichi Hayashi (NAIST) EMCJ2022-53 MW2022-99 EST2022-63
The threats of electromagnetic (EM) information leakage induced by low-power intentional EM interference have been repor... [more] EMCJ2022-53 MW2022-99 EST2022-63
pp.93-96
HWS 2022-04-26
13:30
Tokyo AIST Tokyo Waterfront (Annex)
(Primary: On-site, Secondary: Online)
Fundamental Study on ID Generation Method Focusing on Distribution of Capacitance Sensor Output Values
Shugo Kaji, Ayaki Tachikake, Daisuke Fujimoto, Yuichi Hayashi (NAIST) HWS2022-4
An individual identification using a capacitance sensor configured with a constant current source and an A/D converter i... [more] HWS2022-4
pp.19-23
VLD, HWS [detail] 2022-03-08
16:10
Online Online Fundamental Evaluation Method for EM Information Leakage Caused by Hardware Trojans on Signal Cables -- Impact of Modulation Factor and Emission Intensity --
Taiga Yukawa, Shugo Kaji, Daisuke Fujimoto, Yuichi Hayashi (NAIST) VLD2021-103 HWS2021-80
The threats of electromagnetic (EM) information leakage caused by hardware Trojans (HTs) implemented on signal cables ha... [more] VLD2021-103 HWS2021-80
pp.153-157
SeMI 2022-01-21
10:30
Nagano
(Primary: On-site, Secondary: Online)
A Study of Disaster Response IoT(DR-IoT) Wireless System
Yasunori Owada (NICT), Mineo Takai (Osaka Univ.), Shugo Kajita (Space-Time Engineering Japan), Tetsushi Ikegami (Meiji Univ.), Susumu Ishihara, Arata Kato (Shizuoka Univ.), Hiroshi Yamamoto (Ritsumeikan Univ.) SeMI2021-79
 [more] SeMI2021-79
pp.109-113
HWS, ICD [detail] 2021-10-19
14:20
Online Online Fundamental Study on Hardware Trojan Detection on Cable Using On-chip Sensor
Yo Nishitoba, Shugo Kaji (NAIST), Masahiro Kinugawa (Fukuchiyama Univ.), Daisuke Fujimoto, Yuichi Hayshi (NAIST) HWS2021-48 ICD2021-22
There have been reports of threats that cause information leakage by inserting Hardware Trojans (HT) into the connection... [more] HWS2021-48 ICD2021-22
pp.38-42
HWS, ICD [detail] 2021-10-19
15:25
Online Online Fundamental Study on Individual Identification of Printed Circuit Boards Using Capacitance Sensors
Ayaki Tachikake, Shugo Kaji, Daisuke Fujitomo, Yu-ichi Hayashi (NAIST) HWS2021-50 ICD2021-24
Individual identification technology using Physical Unclonable Functions (PUFs) guarantees the authenticity of semicondu... [more] HWS2021-50 ICD2021-24
pp.49-52
EMD 2021-03-08
16:15
Online Online Fundamental Study on Effect of Surface Roughness of Contact Boundary and Torque Value on High-Frequency Characteristics of Connectors
Hiroyuki Ueda, Shugo Kaji, Daisuke Fujimoto, Youngwoo Kim, Yuichi Hayashi (NAIST) EMD2020-37
Wear occurs on the contact surface due to sliding and vibration of the connector. This increases the contact resistance,... [more] EMD2020-37
pp.40-43
EMD 2020-12-04
15:50
Online Online Fundamental Evaluation of Impedance Variations in the Connector Caused by High-Frequency Noise Propagation
Hiroyuki Ueda, Shugo Kaji, Youngwoo Kim, Daisuke Fujimoto (NAIST), Taiki Kitazawa, Takashi Kasuga (NIT,Nagano College)), Yuichi Hayashi (NAIST) EMD2020-24
As the operating frequency of information devices increases, the noise generated by the device is also becoming broadban... [more] EMD2020-24
pp.34-38
ICD, HWS [detail] 2020-10-26
09:50
Online Online Fundamental Evaluation Method of EM Information Leakage Caused by Intentional Electromagnetic Interference -- Impact of Impedance Change in Digital Output Circuits --
Shugo Kaji, Daisuke Fujimoto (NAIST), Masahiro Kinugawa (Univ. of Fukuchiyama), Yuichi Hayashi (NAIST) HWS2020-27 ICD2020-16
New threats have been shown to cause information leakage by irradiating electromagnetic (EM) waves of specific intensity... [more] HWS2020-27 ICD2020-16
pp.13-17
EMCJ 2020-07-02
15:20
Online Online Fundamental Evaluation of EM Information Leakage Caused by Intentional Electromagnetic Interference
Shugo Kaji, Daisuke Fujimoto, Yuichi Hayashi (NAIST) EMCJ2020-15
The threat of electromagnetic (EM) information leakage has been focused on the acquisition of information inside the dev... [more] EMCJ2020-15
pp.25-28
SeMI 2020-01-31
10:00
Kagawa   [Poster Presentation] Disaster Aid Station Management System with Data Exchange Support for Collaborative Activities
Shugo Kajita, Edgar Marko Trono, Gemalyn Abrajano, Jovilyn Fajardo, Taka Maeno (Space-Time Engineering Japan, Inc.) SeMI2019-108
In the event of a large scale disaster such as the Nankai Trough Earthquake, wide-area medical rescue activities will be... [more] SeMI2019-108
pp.45-46
HWS
(2nd)
2019-12-06
16:00
Tokyo Asakusabashi Hulic Conference [Poster Presentation] Evaluation of Information Leakage Induced by IEMI from ICs with Multiple Data Communication Lines
Riho Kawakami, Shugo Kaji (NAIST), Masahiro Kinugawa (NIT, Sendai College), Daisuke Fujimoto, Yu-ichi Hayashi (NAIST)
 [more]
ISEC, SITE, ICSS, EMM, HWS, BioX, IPSJ-CSEC, IPSJ-SPT [detail] 2019-07-24
09:55
Kochi Kochi University of Technology Fundamental Study on an Estimation Method of Irradiate Frequencies to Forcibly Cause Electromagnetic Information Leakage
Shugo Kaji (NAIST), Masahiro Kinugawa (NIT), Daisuke Fujimoto, Yu-ichi Hayashi (NAIST) ISEC2019-40 SITE2019-34 BioX2019-32 HWS2019-35 ICSS2019-38 EMM2019-43
The threats of electromagnetic (EM) information leakage from the input/output (I/O) signal of an IC mounted on a de-vice... [more] ISEC2019-40 SITE2019-34 BioX2019-32 HWS2019-35 ICSS2019-38 EMM2019-43
pp.235-238
HWS 2019-04-12
15:55
Miyagi Tohoku University Fundamental Study on Suppression of Self-Interference Wave Caused by Intentional Information Leakage with IEMI
Riho Kawakami, Shugo Kaji (NAIST), Masahiro Kinugawa (NIT, Sendai College), Diasuke Fujimoto, Yu-ichi Hayashi (NAIST) HWS2019-6
There is a threat of information leakage through unintentional electromagnetic (EM) emissions from equipment. The feasib... [more] HWS2019-6
pp.31-35
HWS, VLD 2019-02-28
16:45
Okinawa Okinawa Ken Seinen Kaikan Fundamental Study on Individual Identification Method of Electronic Device Using Difference of Radiation Spectrum Caused by Manufacturing/Mounting Variations
Shugo Kaji (NAIST), Masahiro kinugawa (NIT), Daisuke Fujimoto (NAIST), Laurent Sauvage, Jean-Luc Danger (Telecom ParisTech), Yu-ichi Hayashi (NAIST) VLD2018-120 HWS2018-83
There is a possibility that electronic devices which contain counterfeited/cloned ICs or electronic components cause ser... [more] VLD2018-120 HWS2018-83
pp.163-167
EMCJ 2018-07-27
14:55
Tokyo Kikai-Shinko-Kaikan Bldg. Fundamental Study on Data Injection Attacks Using a Hardware Trojan against ICT Devices
Shugo Kaji (NAIST), Masahiro Kinugawa (NIT), Daisuke Fujimoto, Yu-ichi Hayashi (NAIST) EMCJ2018-30
Intentional electromagnetic interference (IEMI) is a threat to destroy integrated circuits (ICs) or elements by using hi... [more] EMCJ2018-30
pp.49-54
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