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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
DC 2018-02-20
09:55		 Tokyo Kikai-Shinko-Kaikan Bldg. A Test Register Assignment Method for Operational Units to Reduce the Number of Test Patterns for Transition Faults Using Controller Augmentation
Yuki Takeuchi, Shun Takeda, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.) DC2017-78		 It is required to reduce the number of test patterns to reduce test cost for VLSIs. Especially, design-for-testability m... [more] DC2017-78
pp.7-12
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]		 2017-11-06
15:20		 Kumamoto Kumamoto-Kenminkouryukan Parea A Test Register Assignment Method to Reduce the Number of Test Patterns at Register Transfer Level Using Controller Augmentation
Shun Takeda, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyoto Sangyo Univ) VLD2017-37 DC2017-43		 Recently, it is very important to reduce the number of test patterns by using design-for-testability (DFT) with the incr... [more] VLD2017-37 DC2017-43
pp.61-66
MVE, HI-SIG-VR 2013-09-26
18:10		 Hokkaido Rishiri Island, "Donto" Noise suppression device consisting of microcomputer and DSP
Shun Takeda (Tokyo Univ. of Science Suwa), Takahiro Natori (Tokyo Univ. of Science), Nari Tanabe (Tokyo Univ. of Science Suwa), Toshihiro Furukawa (Tokyo Univ. of Science) MVE2013-29		  [more] MVE2013-29
pp.101-105
MVE 2013-05-18
10:30		 Osaka Osaka University, Toyonaka campus Stereo type karaoke Aplication with noise suplession method
Shun Takeda (Tokyo Univ. Of Science, Suwa), Takahiro Natori (Tokyo Univ. Of Science), Nari Tanabe (Tokyo Univ. Of Science, Suwa), Toshihiro Furukawa (Tokyo Univ. Of Science) MVE2013-5		  [more] MVE2013-5
pp.63-68
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