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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM |
2012-11-15 10:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg |
[Invited Talk]
2012 SISPAD Paper Review
-- Compact Model, Device Variability, Device Reliability -- Takahiro Iizuka (Hiroshima Univ.) SDM2012-99 |
Briefly reviewed are papers presented at 2012 SISPAD, particularly focused on compact model, device variability, and dev... [more] |
SDM2012-99 pp.5-7 |
MBE |
2012-06-22 10:20 |
Hokkaido |
Hokkaido University |
Accuracy evaluation of a system for measurement and analysis of tremor using a three-axis accelerometer. Noritaka Mamorita (HIT), Takahiro Iizuka (Kitasato Univ), Masaji Yamashita, Masataka Kitama, Hisae Shimizu, Junji Arisawa (HIT), Harukazu Tsuruta, Akihiro Takeuchi, Noriaki Ikeda (Kitasato Univ) MBE2012-14 |
We developed an analyzing system for tremor using the three-axis accelerometer built into the Wii Remote in 2008. We pro... [more] |
MBE2012-14 pp.9-12 |
SDM |
2010-11-12 14:40 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Proposal of a Fitting Accuracy Metric suitable for Compact Model Qualification in all MOSFET Operation Region Hironori Sakamoto, Takahiro Iizuka (Renesas Electronics) SDM2010-182 |
Proposed is a fitting accuracy metric suitable for compact model qualification in all MOSFET operation regions. Fitting ... [more] |
SDM2010-182 pp.59-64 |
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