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Committee Date Time Place Paper Title / Authors Abstract Paper #
ITE-IDY, EID, SID-JC [detail] 2019-08-02
15:55		 Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Lecture] High-resolution full-color rewritable sheets realizing photo-quality image
Yuriko Kaino, Kenichi Kurihara, Aya Shuto, Hiroshi Mizuno, Yuki Oishi, Takahiro Kamei, Kazumasa Nomoto (R&D Center, Sony corp.) 		 [more]
ICD, SDM 2010-08-27
16:25		 Hokkaido Sapporo Center for Gender Equality On the Gate-Stack Origin Threshold Voltage Variability in Scaled FinFETs and Multi-FinFETs
Yongxun Liu, Kazuhiko Endo, Shinich Ouchi (AIST), Takahiro Kamei (Meiji Univ.), Junichi Tsukada, Hiromi Yamauchi, Yuki Ishikawa (AIST), Tetsuro Hayashida (Meiji Univ.), Kunihiro Sakamoto, Takashi Matsukawa (AIST), Atsushi Ogura (Meiji Univ.), Meishoku Masahara (AIST) SDM2010-151 ICD2010-66		 The threshold voltage (Vt) variability in scaled FinFETs with gate length down to 20 nm was systematically investigated.... [more] SDM2010-151 ICD2010-66
pp.149-154
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