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All Technical Committee Conferences (Searched in: All Years)
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| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| ISEC |
2010-05-21
13:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
The Suggestion of Corrected Non-overlapping Template Matching Test
Yuichi Takeda (KAIT), Mituaki Huzii, Toshinari Kamakura, Norio Watanabe, Takakazu Sugiyama (Chuo Univ.)  ISEC2010-1 |
[more] |
ISEC2010-1
pp.1-4 |
| ISEC |
2009-05-22
10:20 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Corrected Non-overlapping Template Matching Test
Yuichi Takeda (Kanagawa Inst. of Tech.), Mituaki Huzii, Toshinari Kamakura, Norio Watanabe, Takakazu Sugiyama (Chuo Univ.) ISEC2009-2 |
[more] |
ISEC2009-2
pp.9-12 |
| ISEC |
2007-12-19
09:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Tests of Random Number and Autocorrelation Test for Cryptographic Applications
Yuichi Takeda (KAIT), Mituaki Huzii, Toshinari Kamakura, Norio Watanabe, Takakazu Sugiyama (Chuo Univ.) ISEC2007-112 |
[more] |
ISEC2007-112
pp.1-3 |
| ISEC |
2006-12-13
09:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Autocorrelation Test of Binary Sequence for Cryptographic Applications
Yuichi Takeda, Mituaki Huzii, Toshinari Kamakura, Norio Watanabe, Takakazu Sugiyama (Chuo Univ.) |
[more] |
ISEC2006-101
pp.1-3 |
| ISEC |
2005-12-16
10:40 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
The problem of template matching test in the testing randomness by NIST
Yuichi Takeda, Mituaki Huzii, Toshinari Kamakura, Norio Watanabe, Takakazu Sugiyama (Chuo Univ.) |
[more] |
ISEC2005-110
pp.1-4 |
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