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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM |
2023-06-26 11:30 |
Hiroshima |
Hiroshima Univ. (Res. Inst. of Nanodevices) |
Characterization of ultrathin SiO2/SiC interfaces by using self-assembled monolayers Ryo Okuhira (Kwansei Gakuin Univ.), Takamasa Kawanago (Tokyo Tech), Takuji Hosoi (Kwansei Gakuin Univ.) SDM2023-29 |
We have successfully evaluated ultrathin SiO2/4H-SiC(0001) interface property by stacking self-assembled monolayer (SAM)... [more] |
SDM2023-29 pp.7-10 |
SDM |
2022-06-21 16:40 |
Aichi |
Nagoya Univ. VBL3F |
[Invited Talk]
Low Voltage Operation of CMOS Inverter based on WSe2 n/p FETs Takamasa Kawanago, Takahiro Matsuzaki, Ryosuke Kajikawa, Iriya Muneta, Takuya Hoshii, Kuniyuki Kakushima, Kazuo Tsutsui, Hitoshi Wakabayashi (Tokyo Tech) SDM2022-30 |
[more] |
SDM2022-30 pp.23-26 |
SDM |
2017-06-20 15:35 |
Tokyo |
Campus Innovation Center Tokyo |
Heavily-doped SOI Substrate and Transfer Printing for Fabrication of TMDC FETs Takamasa Kawanago, Ryo Ikoma, Hiroyuki Takagi, Shunri Oda (Tokyo Inst. of Tech.) SDM2017-28 |
[more] |
SDM2017-28 pp.35-38 |
SDM |
2016-06-29 16:20 |
Tokyo |
Campus Innovation Center Tokyo |
[Invited Lecture]
Self-assembled monolayer-based gate dielectrics for low voltage MoS2 FET Takamasa Kawanago, Shunri Oda (Tokyo Tech.) SDM2016-45 |
In this study, self-assembled-monolayer (SAM)-based gate dielectrics is applied to the fabrication of molybdenum disulfi... [more] |
SDM2016-45 pp.69-74 |
SDM |
2011-07-04 09:00 |
Aichi |
VBL, Nagoya Univ. |
High Temperature Annealing with MIPS Structure for Improving Interfacial Property at La-silicate/Si Interface and Achieving Scaled EOT Takamasa Kawanago, Kuniyuki Kakushima, Parhat Ahmet, Kazuo Tsutsui, Akira Nishiyama, Nobuyuki Sugii, Kenji Natori, Takeo Hattori, Hiroshi Iwai (Tokyo Tech.) SDM2011-50 |
This paper reports our experimental study for further EOT scaling with small interface state density based on controllin... [more] |
SDM2011-50 pp.1-5 |
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