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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
MW, ED |
2019-01-18 11:05 |
Tokyo |
Hitachi, Central Research Lab. |
Investigation of the Pulsed-IV Degradation Mechanism of GaN-HEMT under High Temperature Storage Tests Yasunori Tateno (Sumitomo Electric), Yasuyo Kurachi (Sumitomo Electric Device Innovations), Hiroshi Yamamoto, Takashi Nakabayashi (Sumitomo Electric) ED2018-82 MW2018-149 |
The purpose of this study is to investigate the physical mechanism of pulsed-IV degradation under high temperature stora... [more] |
ED2018-82 MW2018-149 pp.71-74 |
OPE, LQE |
2014-06-20 15:15 |
Tokyo |
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Development of a Compact 224Gb/s DP-16QAM Modulator Module with Linear Driver ICs Taizo Tatsumi, Naoki Itabashi, Tomoko Ikagawa, Naoya Kono, Morihiro Seki, Keiji Tanaka, Kazuhiro Yamaji, Yasushi Fujimura, Katsumi Uesaka, Takashi Nakabayashi, Hajime Shoji, Shoichi Ogita (SEI) OPE2014-18 LQE2014-23 |
The digital coherent transmission technology using multi-level modulation has been considered to be a promising candidat... [more] |
OPE2014-18 LQE2014-23 pp.27-30 |
OPE, CPM, R |
2009-04-17 13:40 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Electrostatic-Discharge Tolerance of AlGaInAs Laser Diodes Hiroyuki Ichikawa, Chie Fukuda, Shinji Matsukawa, Kotaro Hamada, Nobuyuki Ikoma, Takashi Nakabayashi (Sumitomo Electric Industries, Ltd.) R2009-2 CPM2009-2 OPE2009-2 |
This is a report on electrostatic discharge (ESD)-induced degradation of AlGaInAs/InP laser diodes. We found that the do... [more] |
R2009-2 CPM2009-2 OPE2009-2 pp.7-10 |
CPM, OPE, R |
2007-04-20 15:45 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Degradation analysis of GaInAsP/InP laser diode Hiroyuki Ichikawa, Masashi Ito, Chie Fukuda, Kotaro Hamada, Akira Yamaguchi, Takashi Nakabayashi (Sumitomo Electric Industries) R2007-6 CPM2007-6 OPE2007-6 |
ESD-induced degradation is one of the serious reliability problems of GaInAsP/InP LD. We have conducted an analysis on E... [more] |
R2007-6 CPM2007-6 OPE2007-6 pp.29-33 |
OPE, R, CPM |
2005-04-22 13:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Degradation analysis of GaInAsP/InP laser diodes Kotaro Hamada, Hiroyuki Ichikawa, Shinji Matsukawa, Takashi Nakabayashi, Akira Yamaguchi, Takashi Kato (Sumitomo Electric) |
[more] |
R2005-3 CPM2005-3 OPE2005-3 pp.11-15 |
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