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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2009-12-03 10:40 |
Kochi |
Kochi City Culture-Plaza |
An Approach to Dependable Chip Multiprocessors with Process Pair and Swap Mechanism Tomohide Nagai, Masashi Imai, Takashi Nanya (Univ. of Tokyo) VLD2009-51 DC2009-38 |
With the down scale of technology and the increase of transistor count, future processors are expected to be more suscep... [more] |
VLD2009-51 DC2009-38 pp.67-72 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2008-11-19 11:15 |
Fukuoka |
Kitakyushu Science and Research Park |
Leakage Power Reduction Method for Dual-Rail Four-Phase Asynchronous Circuits Using Multi-Vth Transistors Koei Takada, Masashi Imai, Hiroshi Nakamura, Takashi Nanya (U. of Tokyo) VLD2008-90 DC2008-58 |
Dual-rail four-phase asynchronous circuits are well-known for their benefits in terms of delay variation tolerance. On t... [more] |
VLD2008-90 DC2008-58 pp.183-188 |
VLD, CPSY, RECONF, DC, IPSJ-SLDM, IPSJ-ARC (Joint) [detail] |
2007-11-20 10:55 |
Fukuoka |
Kitakyushu International Conference Center |
A process-variation-aware low-power technique using current control Kyun-dong Kim, Masashi Imai, Masaaki Kondo, Hiroshi Nakamura, Takashi Nanya (Univ. of Tokyo) VLD2007-76 DC2007-31 |
Due to process variations, the difference of the operation speed between pipeline stages is increased,resulting in a num... [more] |
VLD2007-76 DC2007-31 pp.37-42 |
RECONF, CPSY, VLD, DC, IPSJ-SLDM, IPSJ-ARC (Joint) [detail] |
2006-11-28 16:10 |
Fukuoka |
Kitakyushu International Conference Center |
Proposal of a Behavioral Synthesis Method for Asynchronous Circuits in Bundled-data Implementation Naohiro Hamada, Takao Konishi, Hiroshi Saito (The Univ. of Aizu), Tomohiro Yoneda (NII), Takashi Nanya (The Univ. of Tokyo) |
[more] |
VLD2006-63 DC2006-50 pp.71-76 |
DE, DC |
2006-10-17 11:30 |
Tokyo |
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Tolerating Interaction Faults Originated From External Systems Bogdan Tomoyuki Nassu, Takashi Nanya (Univ. of Tokyo) |
This work introduces a new scenario and a fault model for tolerating interaction faults. This issue becomes more critica... [more] |
DE2006-120 DC2006-27 pp.7-12 |
ICD, SDM |
2006-08-17 10:20 |
Hokkaido |
Hokkaido University |
Low power delay-insensitive asynchronous curcuits using 1-out-of-4 encoding. Tomohiro Fujii, Masashi Imai, Hiroshi Nakamura, Takashi Nanya (Univ. of Tokyo) |
[more] |
SDM2006-128 ICD2006-82 pp.19-24 |
CPSY, DC |
2006-04-14 13:30 |
Tokyo |
Takeda Hall |
[Invited Talk]
Dependable Computing --- the past, present and future Takashi Nanya (Univ. Tokyo) |
We review fundamental concepts and established technologies for dependable computing, survey current challenges to assur... [more] |
CPSY2006-7 DC2006-7 pp.37-42 |
VLD, ICD, DC, IPSJ-SLDM |
2005-11-30 16:35 |
Fukuoka |
Kitakyushu International Conference Center |
A Discussion about Timing Signal Design Considering Delay Variation Masashi Imai, Kouichi Watanabe, Masaaki Kondo, Hiroshi Nakamura, Takashi Nanya (Univ. Tokyo) |
As the VLSI technology advances, delay variations become extremely
large. There are many factors that cause delay varia... [more] |
VLD2005-59 ICD2005-154 DC2005-36 pp.31-36 |
VLD, ICD, DC, IPSJ-SLDM |
2005-11-30 17:00 |
Fukuoka |
Kitakyushu International Conference Center |
Design of High Performance and Low Power Arithmetic Circuits Considering Bit Delay Variation Kouichi Watanabe, Masashi Imai, Masaaki Kondo, Hiroshi Nakamura, Takashi Nanya (Univ. Tokyo) |
As the VLSI technology advances, delay variations will become more serious.
Delay insensitive asynchronous dual-rail ci... [more] |
VLD2005-60 ICD2005-155 DC2005-37 pp.37-42 |
DE, DC |
2005-10-17 14:15 |
Tokyo |
NTT Musashino R&D center |
Hopes and Challenges in Research on Dependable Computing
-- in combination with a report on DSN2005 -- Takashi Nanya (Univ. Tokyo) |
As process technologies decrease in feature size and networks pervade every aspects of modern societies, computer system... [more] |
DE2005-129 DC2005-23 pp.25-30 |
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