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 Results 1 - 6 of 6  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
MW, ICD 2017-03-03
10:25		 Okayama Okayama Prefectural Univ. Study of Wide band width LC type Injection-locked Frequency Divider with Capacitor Array
Yoshitake Nishino, Nobuyuki Itoh, Takayuki Morishita, Kiyotaka Komoku (Okayama Prefectural Univ.) MW2016-206 ICD2016-136		 An injection-locked frequency divider（ILFD）with capacitor array is studied to obtain a wide locking range and high input... [more] MW2016-206 ICD2016-136
pp.101-106
EMCJ, IEE-EMC, MW, EST [detail] 2015-10-23
10:55		 Miyagi Sakura Hall, Katahira Campus, Tohoku Univ. [Invited Lecture] A Study of High-Frequency Characteristics of Stripe Shaped Inductor and its application for Voltage-Controlled Oscillator
Nobuyuki Itoh, Hiroki Tsuji (Okayama Pref. Univ.), Yuka Itano (Okayama Pref. Univ./Toshiba), Takayuki Morishita, Kiyotaka Komoku (Okayama Pref. Univ.), Sadayuki Yoshitomi (Toshiba Corp.) EMCJ2015-74 MW2015-113 EST2015-84		  [more] EMCJ2015-74 MW2015-113 EST2015-84
pp.97-102
ICD, ITE-IST 2014-07-04
13:25		 Shimane Izumo-shi (Shimane) [Invited Talk] A study of enhancement of Q-factor of LC Resonators in high frequency region
Nobuyuki Itoh, Yuka Itano, Hiroki Tsuji, Kiyotaka Komoku, Takayuki Morishita (Okayama Prefec. Univ.), Sadayuki Yoshitomi (Toshiba) ICD2014-24		 An enhancement of Q-factor of LC resonators in millimeter wave and quasi-millimeter wave has been studied. Q-factor of L... [more] ICD2014-24
pp.65-70
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]		 2009-12-04
15:20		 Kochi Kochi City Culture-Plaza Performance Evaluation of Dynamially Reconfigurable VLD Circuit
Kiyotaka Komoku, Takashi Miyake, Takayuki Morishita (Okayama Pref. Univ.) 		 [more]
ICD, SDM 2006-08-18
09:00		 Hokkaido Hokkaido University A Test Structure to Separately Analyze CMOSFET Reliabilities along The Channel Width
Takashi Ohzone, Eiji Ishii, Takayuki Morishita, Kiyotaka Komoku (Okayama Pref. Univ.), Toshihiro Matsuda, Hideyuki Iwata (Toyama Pref. Univ.) 		A test structure with four kinds of MOSFETs(i.e., [A]([D]) with a short(long) channel-length all over the channel width,... [more] SDM2006-142 ICD2006-96
pp.99-104
ICD, SDM 2005-08-18
13:50		 Hokkaido HAKODATE KOKUSAI HOTEL A Test Structure to Analyze (Highly-Doped)/(Lightly-Doped)-Drain in LDD-type CMOSFET
Takashi Ohzone (Okayama Pref. Univ.), Toshihiro Matsuda (Toyama Pref. Univ.), Kazuhiko Okada, Takayuki Morishita, Kiyotaka Komoku (Okayama Pref. Univ.), Hideyuki Iwata (Toyama Pref. Univ.) 		A test structure to separately measure sheet resistances of highly-doped-drain (HDD) and lightly- doped-drain (LDD) in L... [more] SDM2005-137 ICD2005-76
pp.55-60
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