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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM, VLD |
2007-10-31 15:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Scaled CMOS Modeling on Analog Small Signal parameters Takeshi Kida, Shin-ichi Ohkawa, Hiroo Masuda (Renesas) VLD2007-67 SDM2007-211 |
In sub-100-nm device, mismatch characteristics of threshold voltage and drain current have been degraded. This phenomeno... [more] |
VLD2007-67 SDM2007-211 pp.35-39 |
SDM, VLD |
2007-10-31 15:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Technical Trends of Mismatch Modeling on Analog CMOS Circuit Hiroo Masuda, Takeshi Kida, Shin-ichi Ohkawa (Renesas) VLD2007-69 SDM2007-213 |
In sub-100-nm device, mismatch characteristics of threshold voltage and drain current have been degraded. This phenomeno... [more] |
VLD2007-69 SDM2007-213 pp.47-54 |
ICD, ITE-CE |
2006-12-15 09:50 |
Hiroshima |
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Modeling and Simulation of Mismatch Characteristics on Analog CMOS Circuits Takeshi Kida, Shin-ichi Ohkawa, Hiroo Masuda (Renesas) |
[more] |
ICD2006-160 pp.97-102 |
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