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Committee Date Time Place Paper Title / Authors Abstract Paper #
CPM 2011-08-10
13:25		 Aomori   DLTS evaluation of carrier injection and emission properties in In(Ga)As stacked quantum dot structure
Soitiro Suzuki, Shinya Sato, Takuro Iwasaki (Hirosaki Univ.), Takehiko Tawara, Kouta Tateno, Hideki Gotoh, Tetsuomi Sogawa (NTT), Hiroshi Okamoto (Hirosaki Univ.) CPM2011-57		 A ten-layer quantum-dot structure with GsAsP strain-compensation layer grown by using Bi surfactant was evaluated by DLT... [more] CPM2011-57
pp.7-10
CPM 2011-08-10
16:35		 Aomori   Evaluation of interface state density of Ge-MIS structure by combination of conductance technique at low temperature and room temperature
Takuro Iwasaki, Shinya Sato, Soitiro Suzuki, Toshiro Ono (Hirosaki Univ.), Yukio Fukuda (Tokyo Univ. of Science, Suwa,), Hiroshi Okamoto (Hirosaki Univ.) CPM2011-64		 Ge-MIS structures have attracted the attention for next generation device, which may take the place of Si-MOS devices. H... [more] CPM2011-64
pp.43-46
CPM 2011-08-10
17:00		 Aomori   Evaluation of Ge-MIS structure fabricated by ECR plasma techniques by DLTS and C-t measurement
Shinya Sato, Takuro Iwasaki, Soitiro Suzuki, Toshiro Ono (Hirosaki Univ.), Yukio Fukuda (Tokyo Univ. of Science, Suwa), Hiroshi Okamoto (Hirosaki Univ.) CPM2011-65		 In recent years, a Ge-MIS structure has attracted the attention for the candidate of a next generation device. However, ... [more] CPM2011-65
pp.47-50
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