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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
WPT |
2024-12-12 10:30 |
Ishikawa |
Ohgigaoka Campus, Kanazawa Institute of Technology (Primary: On-site, Secondary: Online) |
Transferred Power and Topological Structure in Wireless Power Transfer Lunde Ardhenta, Takuya Hirata, Ichijo Hodaka (Univ. Miyazaki) WPT2024-26 |
[more] |
WPT2024-26 pp.12-16 |
R |
2017-11-16 15:30 |
Osaka |
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Effects on Stresses in HALT Raphael Pihet, Takuya Hirata, Hideki Kawai, Aoki Yuichi (ESPEC) R2017-53 |
HALT (Highly Accelerated Limit Test) is an accelerated test which, by applying severe stresses, can identify the relativ... [more] |
R2017-53 pp.13-16 |
ASN |
2015-11-06 16:40 |
Tokyo |
NICT Koganei HQ |
Measurement and Analysis Trial of Strawberry Cultivation data for Local Agricultures Atsushi Daikoku, Toshikatsu Mori, Jeong Wookyeong, Eiji Miyagaki, Takuya Hiratani (KOZO KEIKAKU), Satoshi Yamazaki (Numazu NIT), Takeshi Sasaki (Strawberry full-time farmer), Shinichiro1 Maejima, Hidenori Izusawa (Shizuoka Prefecture) ASN2015-76 |
[more] |
ASN2015-76 pp.157-160 |
RECONF |
2015-06-20 14:25 |
Kyoto |
Kyoto University |
Tile-base PLA Cell with Uni-Switch Structure Atsushi Nanri, Kosuke Murakami, Daijiro Murooka, Takuya Hirata, Qing Dong, Shigetoshi Nakatake (Univ. of Kitakyushu) RECONF2015-23 |
[more] |
RECONF2015-23 pp.125-130 |
CAS, SIP, MSS, VLD, SIS [detail] |
2014-07-11 13:20 |
Hokkaido |
Hokkaido University |
Block-merge layout of an op-amp pair and its variability evaluation Masashi Miyagawa, Masaya Shimoyama, Koichi Tanno (Miyazaki Univ.), Takuya Hirata, Ryuta Nishino, Shigetoshi Nakatake (Univ. of Kitakyushu), Akihiro Yamada (A.LSI Design Co.,LTD) CAS2014-39 VLD2014-48 SIP2014-60 MSS2014-39 SIS2014-39 |
[more] |
CAS2014-39 VLD2014-48 SIP2014-60 MSS2014-39 SIS2014-39 pp.207-212 |
R |
2011-11-18 14:10 |
Osaka |
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Temperature Humidity Test of Silver-Epoxy Isotropic Conductive Adhesive Takuya Hirata, Yuichi Aoki (ESPEC CORP.) R2011-35 |
To evaluate the reliability test condition for Isotropic Conductive Adhesive (ICA), we curried out various temperature h... [more] |
R2011-35 pp.13-17 |
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