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Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, HWS [detail] 2022-03-08
11:25
Online Online A Method for Automatic Test Pattern Generation using an SMT Solver for HDL Code
Ryoichi Isawa, Nobuyuki Kanaya, Yoshitada Fujiwara, Tatsuta Takehisa, Hayato Ushimaru, Dai Arisue, Daisuke Makita, Satoshi Mimura, Daisuke Inoue (NICT) VLD2021-95 HWS2021-72
(To be available after the conference date) [more] VLD2021-95 HWS2021-72
pp.105-110
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