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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM, OME 2016-04-09
10:10		 Okinawa Okinawa Prefectural Museum & Art Museum [Invited Talk] Low-temperature processed self-aligned InGaZnO thin-film transistors for flexible device applications
Mamoru Furuta, Tatsuya Toda, Gengo Tatsuoka, Yusaku Magari (Kochi Univ. of Technol.) SDM2016-13 OME2016-13		  [more] SDM2016-13 OME2016-13
pp.53-56
SDM, OME 2016-04-09
10:50		 Okinawa Okinawa Prefectural Museum & Art Museum Device simulation analysis of carrier transport in In-Ga-Zn-O thin-film transistors -- Influence of carrier concentration in back-channel region --
Daichi Koretomo, Tatsuya Toda (KUT), Tokiyoshi Matsuda, Mutsumi Kimura (Ryukoku Univ.), Mamoru Furuta (KUT) SDM2016-14 OME2016-14		 The influence of high carrier concentration region in In-Ga-Zn-O (IGZO ) on the electrical properties of a bottom-gate I... [more] SDM2016-14 OME2016-14
pp.57-60
EID, ITE-IDY, IEE-EDD, SID-JC, IEIJ-SSL [detail] 2016-01-28
15:04		 Toyama Toyama Univ. Plasma treatment for source/drain regions of self-aligned InGaZnO thin-film transistors -- Effects of substrate bias during the plasma treatment of IGZO. --
Yusaku Magari, Tatsuya Toda, Hisao Makino, Mamoru Furuta (Kochi Univ. of Technol.) EID2015-31		  [more] EID2015-31
pp.41-44
SS 2014-03-12
09:55		 Okinawa Tenbusu Naha Execution Trace Abstraction by Dynamic Characteristics of Objects
Tatsuya Toda (Nagoya Univ.), Takashi Kobayashi (Tokyo Tech.), Noritoshi Atsumi (Nagoya Univ.), Kiyoshi Agusa (Kyoto Univ.) SS2013-86		 In this paper, we propose a method that abstracts an execution trace to help us to understand an outline of OO-software ... [more] SS2013-86
pp.85-90
SS 2012-03-14
12:05		 Okinawa Tenbusu-Naha Grouping Objects for Executing Trace Analysis based on Design Patterns
Tatsuya Toda, Takashi Kobayashi, Noritoshi Atsumi, Kiyoshi Agusa (Nagoya Univ.) SS2011-82		 In this report, we introduce a novel approach to abstract an object collaboration history using the application informat... [more] SS2011-82
pp.151-156
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