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Committee Date Time Place Paper Title / Authors Abstract Paper #
Tokyo Tokyo Univ. Takeda Bldg. Takeda Hall RISCV-based Hardware Root-Of-Trust for Secure IoT Device Lifecycle Management
Thomas Edison Yu (Rambus K.K.)
(Advance abstract in Japanese is available) [more]
(Joint) [detail]
Fukuoka Kitakyushu International Conference Center Thermal-Aware Test Scheduling with Cycle-Accurate Power Profiles and Test Partitioning
Thomas Edison Yu, Tomokazu Yoneda (NAIST), Krishnendu Chakrabarty (Duke Univ.), Hideo Fujiwara (NAIST) VLD2007-84 DC2007-39
Higher power densities and the non-linear spatial distribution of heat of VLSI chips put greater emphasis on chip-packag... [more] VLD2007-84 DC2007-39
CAS, SIP, VLD 2007-06-22
Hokkaido Hokkaido Tokai Univ. (Sapporo) Power Constrained IP Core Wrapper Design with Partitioned Clock Domains
Thomas Edison Yu, Tomokazu Yoneda (NAIST), Danella Zhao (Unive. of Louisiana), Hideo Fujiwara (NAIST) CAS2007-25 VLD2007-41 SIP2007-55
Rapid developments in VLSI technology has made it possible to embed whole system components onto a single chip, called S... [more] CAS2007-25 VLD2007-41 SIP2007-55
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