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All Technical Committee Conferences  (Searched in: Recent 10 Years)

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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 5 of 5  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM, OME 2023-04-21
13:40		 Okinawa Okinawaken Seinen Kaikan (Okinawa, Online)
(Primary: On-site, Secondary: Online)		 [Invited Talk] Visualization of RGD sites for call adhesion at a molecular resolution
Tomohiro Hayashi, Hiroyuki Tahara (Tokyo TECH) SDM2023-1 OME2023-1		 In this study, we developed a technique using atomic force microscopy (AFM) to visualize the two-dimensional distributio... [more] SDM2023-1 OME2023-1
pp.1-4
OME 2022-02-18
14:30		 Oita Horuto Hall Oita (Oita, Online)
(Primary: On-site, Secondary: Online)		 Analysis of interfacial water using techniques of surface & interface science
Tomohiro Hayashi (Tokyo TECH) OME2021-59		 Understanding the behavior of molecules in the vicinity of biomaterials is essential for investigating the mechanism of ... [more] OME2021-59
pp.7-10
SDM 2018-10-17
14:00		 Miyagi Niche, Tohoku Univ. (Miyagi) [Invited Talk] Fin-FET MONOS for Next Generation Automotive-MCU
Shibun Tsuda, Tomoya Saito, Hirokazu Nagase, Yoshiyuki Kawashima, Atsushi Yoshitomi, Shinobu Okanishi, Tomohiro Hayashi, Takuya Maruyama, Masao Inoue, Seiji Muranaka, Shigeki Kato, Takuya Hagiwara, Hirokazu Saito, Tadashi Yamaguchi, Masaru Kadoshima, Takahiro Maruyama, Tatsuyoshi Mihara, Hiroshi Yanagita, Kenichiro Sonoda, Yasuo Yamaguchi, Tomohiro Yamashita (Renesas) SDM2018-52		  [more] SDM2018-52
pp.1-5
SDM 2018-01-30
14:00		 Tokyo Kikai-Shinko-Kaikan Bldg. (Tokyo) [Invited Talk] Reliability and Scalability of FinFET Split-Gate MONOS Array with Tight Vth Distribution for 16/14nm-node Embedded Flash
Shibun Tsuda, Tomoya Saito, Hirokazu Nagase, Yoshiyuki Kawashima, Atsushi Yoshitomi, Shinobu Okanishi, Tomohiro Hayashi, Takuya Maruyama, Masao Inoue, Seiji Muranaka, Shigeki Kato, Takuya Hagiwara, Hirokazu Saito, Tadashi Yamaguchi, Masaru Kadoshima, Takahiro Maruyama, Tatsuyoshi Mihara, Hiroshi Yanagita, Kenichiro Sonoda, Tomohiro Yamashita, Yasuo Yamaguchi (renesas) SDM2017-94		 Reliability and scalability of split-gate metal-oxide nitride oxide silicon (SG-MONOS) are discussed for 16/14nm-node em... [more] SDM2017-94
pp.13-16
ED, LQE, CPM 2015-11-27
15:50		 Osaka Osaka City University Media Center (Osaka) Electrical characteristics of Si/SiC junctions using surface activated bonding
Tomohiro Hayashi, Jianbo Liang (Osaka City Univ.), Manabu Arai (New Japan Radio Co.), Naoteru Shigekawa (Osaka City Univ.) ED2015-90 CPM2015-125 LQE2015-122		  [more] ED2015-90 CPM2015-125 LQE2015-122
pp.111-115
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