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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 6 of 6  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
DC 2018-02-20
14:25		 Tokyo Kikai-Shinko-Kaikan Bldg. A Golden-Free Hardware Trojan Detection Technique Considering Intra-Die Variation
Fakir Sharif Hossain, Tomokazu Yoneda, Michihiro Shintani, Michiko Inoue (NAIST), Alex Orailoglu (Univ. of California, San Diego) DC2017-84		 High detection sensitivity in the presence of process variation is a key challenge for hardware Trojan detection through... [more] DC2017-84
pp.43-48
VLD, DC, CPSY, RECONF, CPM, ICD, IE
(Joint) [detail]		 2016-11-30
11:45		 Osaka Ritsumeikan University, Osaka Ibaraki Campus A Golden-IC Free Clock Tree Driven Authentication Approach for Hardware Trojan Detection
Fakir Sharif Hossain, Tomokazu Yoneda, Michiko Inoue (NAIST), Alex Orailoglu (UCSD) VLD2016-67 DC2016-61		 Due to outsourcing of numerous stages of the IC manufacturing process in different foundries, security risks such as har... [more] VLD2016-67 DC2016-61
pp.135-140
DC 2016-02-17
11:55		 Tokyo Kikai-Shinko-Kaikan Bldg. Delay fault injection framework based on logic simulation with zero delay model
Shinji Kawasaki, Tomokazu Yoneda, Yuta Yamato, Michiko Inoue (NAIST) DC2015-90		 Fault injection is a technique to re-create faulty behavior of circuits and widely accepted method to evaluate soft erro... [more] DC2015-90
pp.25-30
DC 2016-02-17
14:25		 Tokyo Kikai-Shinko-Kaikan Bldg. Built-In Self-Test with Combination of Weighted Random Pattern and Reseeding
Sayaka Satonaka, Tomokazu Yoneda, Yuta Yamato, Michiko Inoue (NAIST) DC2015-92		 Built-In Self-Test (BIST) is widely used to reduce test cost. However, it is difficult to achieve high fault coverage wi... [more] DC2015-92
pp.37-42
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]		 2015-12-01
12:45		 Nagasaki Nagasaki Kinro Fukushi Kaikan Scan Segmentation Approach to Magnify Detection Sensitivity for Tiny Hardware Trojan
Fakir Sharif Hossain, Tomokazu Yoneda, Michiko Inoue (NAIST) VLD2015-38 DC2015-34		 Outsourcing of IC fabrication components has initiated the potential threat of design tempering using hardware Trojans ... [more] VLD2015-38 DC2015-34
pp.1-6
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]		 2015-12-01
13:50		 Nagasaki Nagasaki Kinro Fukushi Kaikan Background Sequence Generation for Neighborhood Pattern Sensitive Fault Testing in Random Access Memories
Shin'ya Ueoka, Tomokazu Yoneda, Yuta Yamato, Michiko Inoue (NAIST) VLD2015-40 DC2015-36		 The Neighborhood Pattern Sensitive Fault (NPSF) is widely discussed fault model for memories, and it occurs when a memor... [more] VLD2015-40 DC2015-36
pp.19-24
 Results 1 - 6 of 6  /   
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