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Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD, CPSY 2016-12-15
15:30		 Tokyo Tokyo Institute of Technology [Poster Presentation] Error Analysis of NAND Flash Memories for Long-Term Storage
Kyoji Mizoguchi, Tomonori Takahashi, Seiichi Aritome, Ken Takeuchi (Chuo Univ.) ICD2016-72 CPSY2016-78		 Recently, a digital data on art, culture and history which required data-retention (DR) time from 10 to 100 years or mor... [more] ICD2016-72 CPSY2016-78
p.63
ICD 2016-04-15
10:20		 Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Lecture] Highly Reliable Method for Long-Term Semiconductor Data Storage
Tomonori Takahashi, Senju Yamazaki, Shuhei Tanakamaru, Tomoko Ogura Iwasaki, Shogo Hachiya, Ken Takeuchi (Chuo Univ.) 		 [more]
ICD, CPSY 2015-12-17
16:00		 Kyoto Kyoto Institute of Technology [Poster Presentation] Error Pattern Analysis of Long-Term Storage with NAND Flash Memory
Tomonori Takahashi, Senju Yamazaki, Ken Takeuchi (Chuo Univ.) ICD2015-77 CPSY2015-90		 NAND flash memory has advantages of fast access speed and high density compared with other storage devices such as hard ... [more] ICD2015-77 CPSY2015-90
p.53
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