IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: Recent 10 Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 5 of 5  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
KBSE 2024-03-15
15:15
Okinawa Okinawa Prefectual General Welfare Center (Okinawa, Online)
(Primary: On-site, Secondary: Online)
Bayesian Statistical Analysis of Commit History Data Using WBIC for OSS Evolution Analysis
Toru Sugiyama, Takako Nakatani (OUJ) KBSE2023-90
This paper utilizes the latest advancements in computational Bayesian statistics to analyze the commit histories of Open... [more] KBSE2023-90
pp.138-142
KBSE, SC 2023-11-18
11:20
Miyagi Sento Kaikan (Miyagi) Understanding the Nature of OSS Development Projects through Genetic Programming and Agent-Based Modeling
Toru Sugiyama, Takako Nakatani (The Open Univ. of Japan) KBSE2023-46 SC2023-29
In this study, we explore the evolution of Open Source Software (OSS) and its interactions with the development communit... [more] KBSE2023-46 SC2023-29
pp.69-74
KBSE 2021-03-06
14:25
Online Online (Online) KBSE2020-46 In recent years, the use of open source software (OSS) in product software has been increasing in the industrial world, ... [more] KBSE2020-46
pp.71-76
MI 2017-01-18
15:24
Okinawa Tenbusu Naha (Okinawa)
Rie Oyama, Chizuko Isyrygi, Hideyuki Senda, Yuri Sasaki, Gen Haba, Tomonobu Kanasugi, Akihiko Kikuchi, Toru Sugiyama (IMU), Sonia Pujol (HMS) MI2016-115
Introduction: Recently, there has been a growing interest among scientists in the mechanism of developmental the fetal b... [more] MI2016-115
pp.171-176
CPM, LQE, ED 2016-12-12
15:20
Kyoto Kyoto University (Kyoto) Evaluating Current Collapse of GaN HEMT devices by Carrier Number
Kohei Oasa, Akira Yoshioka, Yasunobu Saito, Takuo Kikuchi, Tatsuya Ohguro, Takeshi Hamamoto, Toru Sugiyama (TOSHIBA) ED2016-62 CPM2016-95 LQE2016-78
We report a new method to evaluate current collapse. To exclude self-heating effect during dynamic test, we propose carr... [more] ED2016-62 CPM2016-95 LQE2016-78
pp.27-30
 Results 1 - 5 of 5  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan