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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
NC, NLP, IPSJ-BIO [detail] 2010-06-19
15:10
Okinawa Ryukyu-daigaku-gozyu-syunen-kinenn-kaikan Probabilistic Fault Diagnosis in Large Scale Multicomputer Systems
Manabu Kobayashi, Toshinori Takabatake, Shinya Amano (Shonan Inst. of Tech.), Shigeichi Hirasawa (Cyver Univ.) NLP2010-23 NC2010-23
F.P.Preparata et al.\ have proposed a fault diagnosis model to find all fault nodes in the multiprocessor system by usin... [more] NLP2010-23 NC2010-23
pp.205-210
ICD, SDM 2007-08-23
13:40
Hokkaido Kitami Institute of Technology Energy comparison between various supply voltage scheme for System LSI
Satoshi Hanami, Shigeyoshi Watanabe, Manabu Kobayashi, Toshinori Takabatake (SIT) SDM2007-149 ICD2007-77
 [more] SDM2007-149 ICD2007-77
pp.47-50
ICD, SDM 2007-08-23
14:05
Hokkaido Kitami Institute of Technology Design of high-speed low-power dual-supply-voltage sysytem LSI taking into account of gate/sub-threshold leakage current
Shigeyoshi Watanabe, Satoshi Hanami, Manabu Kobayashi, Toshinori Takabatake (SIT) SDM2007-150 ICD2007-78
 [more] SDM2007-150 ICD2007-78
pp.51-56
SDM 2007-03-15
16:15
Tokyo Kikai-Shinko-Kaikan Bldg. Design method of low-power dual-supply-voltage system LSI taking into account various leakage current of MOSFET
Shigeyoshi Watanabe, Satoshi Hanami, Manabu Kobayashi, Toshinori Takabatake (SIT)
 [more] SDM2006-261
pp.39-44
ICD, VLD 2007-03-09
15:20
Okinawa Mielparque Okinawa Design method of low-power dual-supply-voltage system LSI taking into account gate/subthreshold leakage current of MOSFET
Shigeyoshi Watanabe, Satoshi Hanami, Manabu Kobayashi, Toshinori Takabatake (Shonan Institute of Tech.)
 [more] VLD2006-153 ICD2006-244
pp.75-80
ICD, SIP, IE, IPSJ-SLDM 2006-10-27
10:50
Miyagi   Design method of low-power dual-supply-voltage system LSI taking into account leakage current of MOSFET
Shigeyoshi Watanabe, Masaki Kanai, Akira Nagasawa, Satoshi Hanami, Manabu Kobayashi, Toshinori Takabatake (SIT)
Reduction of power dissipation caused by dynamic current, gate leakage current, and subthreshold leakage current of dual... [more] SIP2006-106 ICD2006-132 IE2006-84
pp.31-36
 Results 1 - 6 of 6  /   
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