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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
EMCJ (2nd) |
2012-11-30 14:10 |
Tokyo |
NICT |
Geometrical Configuration Effect in Reducing FM-Band Cross-Talks between Two Parallel Signal Traces Including Return Grounds on Printed Circuit Boards for Vehicles Michihira Iida (DENSO/NIT), Tsuyoshi Maeno (Qualtec), Jianqing Wang, Osamu Fujiwara (NIT) |
[more] |
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EMCJ, IEE-EMC |
2011-12-09 09:05 |
Aichi |
Nagoya Inst. of Tech. |
Characteristics of FM-Band Cross-Talks between Two Parallel Signal Traces on Printed Circuit Boards with Separated Ground Pattenrs for Vehicles Michihira Iida (DENSO/NIT), Tsuyoshi Maeno (DENSO), Jianqing Wang, Osamu Fujiwara (NIT) EMCJ2011-96 |
It is well known that electromagnetic disturbances in vehicle-mounted radios are mainly caused by conducted noise curren... [more] |
EMCJ2011-96 pp.1-6 |
EMCJ, ITE-BCT |
2011-03-11 15:20 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Dependence on Ground Patterns Size of FM-Band Cross-Talks between Two Parallel Signal Traces on Printed Circuit Boards for Vehicles Michihira Iida, Tsuyoshi Maeno (DENSO), Jianqing Wang, Osamu Fujiwara (NIT) EMCJ2010-126 |
It is well known that electromagnetic disturbances in vehicle-mounted radios are mainly caused by conducted noise curren... [more] |
EMCJ2010-126 pp.45-49 |
EMCJ, EMD |
2010-07-16 15:20 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Size Dependence of Return Ground Patterns on FM-Band Cross-Talks between Two Parallel Signal Traces on Printed Circuit Boards for Vehicles Michihira Iida, Tsuyoshi Maeno (DENSO Corp.), Osamu Fujiwara (Nagoya Inst. of Tech.) EMCJ2010-38 EMD2010-23 |
It is well known that electromagnetic disturbances in vehicle-mounted radios are mainly caused by conducted noise curren... [more] |
EMCJ2010-38 EMD2010-23 pp.37-42 |
MW, EMCJ |
2008-10-23 14:55 |
Yamagata |
Yamagata Univ. |
Characteristics and their Mechanism of FM-Band Cross-Talks between Two Parallel Signal Traces on Printed Circuit Boards Tsuyoshi Maeno (DENSO), Hiroya Ueyama (Nagoya Institute of Technology), Michihira Iida (DENSO), Osamu Fujiwara (Nagoya Institute of Technology) EMCJ2008-62 MW2008-106 |
It is well known that electromagnetic disturbances in vehicle-mounted radios are mainly caused by conducted noise curren... [more] |
EMCJ2008-62 MW2008-106 pp.17-22 |
EMCJ |
2007-12-07 10:35 |
Shizuoka |
Create HAMAMATSU |
FDTD Calculation of Conduction Noise Currents from Printed circuit Board with Ground-Layer Slits Hiroya Ueyama (NIT), Tsuyoshi Maeno (DENSO), Akimasa Hirata, Jianqing Wang, Osamu Fujiwara (NIT) EMCJ2007-96 |
Electromagnetic disturbances for vehicle-mounted radios can be caused mainly by the conduction noise currents flowing ou... [more] |
EMCJ2007-96 pp.1-6 |
EMCJ |
2006-12-15 13:10 |
Aichi |
Nagoya Institute of Technology |
Difference Reduction Effects of Ground Patterns on Conductive Noise Currents from PCB Tsuyoshi Maeno, Takanori Uno, Kouji Ichikawa (DENSO), Osamu Fujiwara (NIT) EMCJ2006-88 |
In this paper, for reducing conductive noise currents from electronic equipment for vehicles, we made a simulation and e... [more] |
EMCJ2006-88 pp.41-46 |
EMCJ |
2006-04-18 15:30 |
Tokyo |
Aoyama Gakuin Univ. (Aoyama Campus) |
FDTD Simulation of Contact Discharge to Single Sided PCB by an ESD-gun Hiroya Ueyama, Takafumi Kondo, Akimasa Hirata, Osamu Fujiwara (Nagoya Inst. of Tech.), Tsuyoshi Maeno (DENSO) EMCJ2006-6 |
The electromagnetic (EM) noise caused by electrostatic discharge (ESD) events due to charged metals is a major source of... [more] |
EMCJ2006-6 pp.31-35 |
EMCJ |
2005-09-09 13:15 |
Kyoto |
Kyoto University |
An Approach to Predict Conducted Noise Current Spectra from Electronics Equipments for Vehicles Tsuyoshi Maeno, Kouji Ichikawa, Takanori Uno, Masaki Miyamoto, Kenji Katoh (DENSO) |
In this paper we made an investigation for reducing electromagnetic emission radiated from electronic equipment for vehi... [more] |
EMCJ2005-72 pp.79-84 |
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