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Committee Date Time Place Paper Title / Authors Abstract Paper #
ED, SDM 2010-06-30
15:10
Tokyo Tokyo Inst. of Tech. Ookayama Campus Threshold Voltage Roll-off Mechanisms in SONOS Flash Memory in Retention Mode Including Trapped Charge Redistribution Effect
Doo-Hyun Kim, Gil Sung Lee, Seongjae Cho, Jung Hoon Lee, Jang-Gn Yun, Dong Hua Li, Yoon Kim, Se Hwan Park, Won Bo Shim, Wandong Kim, Byung-Gook Park (Seoul National Univ.) ED2010-58 SDM2010-59
 [more] ED2010-58 SDM2010-59
pp.37-40
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