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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
CPM, LQE, ED |
2016-12-12 15:20 |
Kyoto |
Kyoto University |
Evaluating Current Collapse of GaN HEMT devices by Carrier Number Kohei Oasa, Akira Yoshioka, Yasunobu Saito, Takuo Kikuchi, Tatsuya Ohguro, Takeshi Hamamoto, Toru Sugiyama (TOSHIBA) ED2016-62 CPM2016-95 LQE2016-78 |
We report a new method to evaluate current collapse. To exclude self-heating effect during dynamic test, we propose carr... [more] |
ED2016-62 CPM2016-95 LQE2016-78 pp.27-30 |
MW, ED |
2009-01-14 16:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg |
Application of High Voltage GaN-HEMT for Electrodelss Fluorescent Lamp Circuit Wataru Saito (Toshiba Corp.), Tomokazu Domon (Toshiba Business and Life Service), Ichiro Omura, Tomohiro Nitta, Yorito Kakiuchi, Yasunobu Saito, Kunio Tsuda, Masakazu Yamaguchi (Toshiba Corp.) ED2008-204 MW2008-169 |
This paper reports the demonstration of the resonant inverter circuit for electrodeless fluorescent lamps using a high-v... [more] |
ED2008-204 MW2008-169 pp.35-40 |
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