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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
MW, ED 2019-01-18
Tokyo Hitachi, Central Research Lab. The failure mode analysis on GaN-HEMT under High temperature operation
Yasuyo Yotsuda (SEDI), Yasunori Tateno, Takumi Yonemura, Masato Furukawa, Hiroshi Yamamoto (SEI), Yukinori Nose, Satoshi Shimizu (SEDI) ED2018-81 MW2018-148
(To be available after the conference date) [more] ED2018-81 MW2018-148
MW, ED 2019-01-18
Tokyo Hitachi, Central Research Lab. Investigation of the Pulsed-IV Degradation Mechanism of GaN-HEMT under High Temperature Storage Tests
Yasunori Tateno (Sumitomo Electric), Yasuyo Kurachi (Sumitomo Electric Device Innovations), Hiroshi Yamamoto, Takashi Nakabayashi (Sumitomo Electric) ED2018-82 MW2018-149
The purpose of this study is to investigate the physical mechanism of pulsed-IV degradation under high temperature stora... [more] ED2018-82 MW2018-149
MW, ED 2017-01-26
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Lecture] Commercialization of GaN-HEMT for High Frequency Application
Yasunori Tateno (Sumitomo Electric) ED2016-97 MW2016-173
 [more] ED2016-97 MW2016-173
SDM, R, ED 2007-11-16
Osaka   Leakage Current Screening for AlGaN/GaN HEMT Mass-Production
Fumikazu Yamaki, Kazuaki Ishii, Masahiro Nishi, Hitoshi Haematsu, Yasunori Tateno, Haruo Kawata (EUD) R2007-52 ED2007-185 SDM2007-220
 [more] R2007-52 ED2007-185 SDM2007-220
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