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All Technical Committee Conferences (Searched in: Recent 10 Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
HIP, HCS, HI-SIGCOASTER [detail] |
2023-05-16 16:25 |
Okinawa |
Okinawa Industry Support Center (Okinawa, Online) (Primary: On-site, Secondary: Online) |
Designing a Care Service through Person-Centered Intervention
-- A Case Study on Extracting Issues towards an Online Rehabilitation Service -- Hiroko Tokunaga, Masayuki Ihara (RIKEN), Hiroki Murakami (Shirakawa Hosupita), Akihiko Koga, Takashi Yukihira (RIKEN/eikyo Univ.), Ryoichi Maeda (RIKEN/UDwork Inc.), Shinpei Saruwatari (RIKEN/Shirakawa Hosupital), Kazuki Takesita (Shirakawa Hosupita), Shinya Hisano (RIKEN/Pref. Univ. of Hiroshima), Masashige Motoe (RIKEN/Tohoku Univ.) HCS2023-41 HIP2023-41 |
This study aims to develop an online rehabilitation exercise service based on a person-centered principle valuing the in... [more] |
HCS2023-41 HIP2023-41 pp.206-211 |
DC |
2021-02-05 14:25 |
Online |
Online (Online) |
Fault Coverage Estimation Method in Multi-Cycle Testing Norihiro Nakaoka, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas Electronics Corp.) DC2020-75 |
[more] |
DC2020-75 pp.36-41 |
VLD, DC, RECONF, ICD, IPSJ-SLDM (Joint) [detail] |
2020-11-17 11:20 |
Online |
Online (Online) |
Control Point Selection Approach for Scan Pattern Reduction under Multi-cycle Test Hikaru Tamaki, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) VLD2020-15 ICD2020-35 DC2020-35 RECONF2020-34 |
[more] |
VLD2020-15 ICD2020-35 DC2020-35 RECONF2020-34 pp.24-29 |
VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2019-11-14 16:10 |
Ehime |
Ehime Prefecture Gender Equality Center (Ehime) |
Analysis of Fault Detection Degradation Issue in Multi-cycle Test Scheme using Probabilistic Evaluation Method Norihiro Nakaoka, Tomoki Aono, Sohshi Kudoh, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) VLD2019-45 DC2019-69 |
In order to ensure the functional safety of advanced autonomous driving systems, a power-on self-test
(POST) is require... [more] |
VLD2019-45 DC2019-69 pp.145-150 |
DC |
2019-02-27 14:05 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. (Tokyo) |
FF Toggle Control Point Selection Methods for Fault Detection Enhancement under Multi-cycle Testing Tomoki Aono, Hanan T.Al-Awadhi, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) DC2018-79 |
Multi-cycle Test is a promising way to reduce the test volume of Logic-BIST (Logic Built-in Self-Test) based POST (Power... [more] |
DC2018-79 pp.49-54 |
CQ, CS (Joint) |
2018-04-20 13:00 |
Hiroshima |
Hiroshima Institute of Technology (Hiroshima) |
[Special Invited Talk]
Past and future of the optical access system standardization Yoichi Maeda (TTC) CS2018-5 CQ2018-13 |
[more] |
CS2018-5 CQ2018-13 pp.23-28(CS), pp.69-74(CQ) |
CS |
2017-07-27 16:35 |
Nagasaki |
Fukue Bunka Kaikan (Nagasaki) |
[Special Invited Talk]
Standardization topics for the future network infrastructure Yoichi Maeda (TTC) CS2017-30 |
This paper clarifies the requirements for future network infrastructure, and explains the technical issues for construct... [more] |
CS2017-30 pp.89-94 |
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