|
|
All Technical Committee Conferences (Searched in: All Years)
|
|
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
LQE, ED, CPM |
2008-11-27 13:35 |
Aichi |
Nagoya Institute of Technology |
Reduction of reverse-bias current in GaN-based metal-oxide-semiconductor diodes operating in UV spectral region Tohru Honda, Shigetoshi Komiyama, Yoshihiro Mashiyama, Kenji Watanabe (Kogakuin Univ.) ED2008-159 CPM2008-108 LQE2008-103 |
The reduction of reverse-bias leakage current in GaN-based Schottky diodes was investigated using an aluminum facepack t... [more] |
ED2008-159 CPM2008-108 LQE2008-103 pp.33-36 |
CPM, ED, LQE |
2007-10-11 14:30 |
Fukui |
Fukui Univ. |
Fabrication of GaN-based UV LEDs with metal, oxide and GaN stacks Shigetoshi Komiyama, Kazuyuki Noguchi, Yoshihiro Mashiyama, Kaori Yoshioka, Tohru Honda (Kogakuin Univ.) |
[more] |
|
CPM, ED, LQE |
2007-10-12 16:05 |
Fukui |
Fukui Univ. |
Fabrication of MgZnO films by molecular precursor method and its application to UV-transparent electrodes Yoshihiro Mashiyama, Kaori Yoshioka, Shigetoshi Komiyama, Shinsuke Adachi, Mitsunobu Satou, Tohru Honda (Kogakuin Univ.) |
[more] |
|
ED, CPM, LQE |
2006-10-06 13:15 |
Kyoto |
|
Fabrication of GaN-based unipolar UV LEDs grown by MOVPE Toshiaki Kobayashi, Shigetoshi Komiyama, Yoshihiro Mashiyama, Tohru Honda (Kogakuin Univ.) |
[more] |
ED2006-167 CPM2006-104 LQE2006-71 pp.83-86 |
|
|
|
Copyright and reproduction :
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
|
[Return to Top Page]
[Return to IEICE Web Page]
|