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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM, VLD 2007-10-31
Tokyo Kikai-Shinko-Kaikan Bldg. Analysis of Inverter and SRAM circuits characteristics fluctuation
Ryo Tanabe, Yoshio Ashizawa, Hideki Oka (Fujitsu Labs.) VLD2007-65 SDM2007-209
 [more] VLD2007-65 SDM2007-209
SDM, VLD 2006-09-25
Tokyo Kikai-Shinko-Kaikan Bldg. To be announced
Ryo Tanabe, Yoshio Ashizawa, Hideki Oka (Fujitsu Laboratories)
 [more] VLD2006-36 SDM2006-157
SDM, VLD 2006-09-26
Tokyo Kikai-Shinko-Kaikan Bldg. To be announced
Yoshio Ashizawa, Hideki Oka (FUJITSU LABORATORIES)
The density gradient approach is presented to device characteristics analysis with random dopant fluctuations. We invest... [more] VLD2006-40 SDM2006-161
ICD 2005-04-15
Fukuoka   New Development of Neutron-induced Soft-Error Simulation Technology
Taiki Uemura, Yoshiharu Tosaka, Yoshio Ashizawa, Hideki Oka, Shigeo Satoh (Fujitsu lab.)
In these years, the interest in soft error becomes increasing. This comes from the problem that the soft error occurs no... [more] ICD2005-19
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