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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM, VLD |
2007-10-31 13:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Analysis of Inverter and SRAM circuits characteristics fluctuation Ryo Tanabe, Yoshio Ashizawa, Hideki Oka (Fujitsu Labs.) VLD2007-65 SDM2007-209 |
[more] |
VLD2007-65 SDM2007-209 pp.25-29 |
SDM, VLD |
2006-09-25 14:20 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
To be announced Ryo Tanabe, Yoshio Ashizawa, Hideki Oka (Fujitsu Laboratories) |
[more] |
VLD2006-36 SDM2006-157 pp.13-18 |
SDM, VLD |
2006-09-26 10:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
To be announced Yoshio Ashizawa, Hideki Oka (FUJITSU LABORATORIES) |
The density gradient approach is presented to device characteristics analysis with random dopant fluctuations. We invest... [more] |
VLD2006-40 SDM2006-161 pp.7-12 |
ICD |
2005-04-15 14:30 |
Fukuoka |
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New Development of Neutron-induced Soft-Error Simulation Technology Taiki Uemura, Yoshiharu Tosaka, Yoshio Ashizawa, Hideki Oka, Shigeo Satoh (Fujitsu lab.) |
In these years, the interest in soft error becomes increasing. This comes from the problem that the soft error occurs no... [more] |
ICD2005-19 pp.37-42 |
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