IEICE Technical Committee Submission System
Conference Schedule		 Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 5 of 5  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
EMCJ 2019-01-18
10:50		 Osaka Osaka University Results of EMC round robin test on emission and immunity test. -- (3) Conducted immunity round robin test --
Yoshitsugu Okuda (KEC Electronic Industry Development Center), Yasushi Asaji (Murata Manufacturing), Takashi Usui (YAMAHA), Mikio Okumura (OMRON), Kazuhiro Kobayashi (IPS), Hiroyoshi Shida (Tokin EMC Engineering), Hisashi Ninomiya (Roland), Mitsuyoshi Maishima (Hamamatsu Photonics), Osami Wada (Kyoto Univ) EMCJ2018-100		  [more] EMCJ2018-100
pp.1-5
EMCJ, IEE-EMC 2018-12-14
13:15		 Aichi   Evaluation of Correlation of EMC test Sites for in-vehicle Equipment (2nd Report) -- Effect of Counterpoise, Cable wiring, Symmetry of Installation of DUT on Measurement --
Takanori UNO (DENSO EMCES), Koji Maeda (Aisin Seiki), Toshiyasu Tanaka (MWF), Hironori Okamoto, Yoshitsugu Okuda (KEC), Osami Wada (Kyoto Univ) EMCJ2018-91		 Because it is often case that EMC measurement of in-vehicle equipment is made at multiple test sites, the data correlati... [more] EMCJ2018-91
pp.45-50
EMCJ, IEE-EMC 2017-12-15
16:15		 Gifu Gifu University Evaluation of Correlation between Reference and a Group of EMC Test Sites for in-vehicle Equipment -- Validation of Reference Data in CISPR 25 Annex J --
Takanori Uno (DENSO EMCES), Koji Maeda (Aisin Seiki), Toshiyasu Tanaka (MWF), Yoshitsugu Okuda (KEC), Osami Wada (Kyoto Univ.) EMCJ2017-86		 Regarding EMC measurement for in-vehicle unit at different test sites, a high correlation between different test sites i... [more] EMCJ2017-86
pp.75-80
EMCJ, IEE-EMC, MW, EST [detail] 2016-10-20
09:25		 Miyagi Tohoku Univ. Results of EMC round robin test on emission and immunity test. -- (2) Radiated immunity round robin test --
Yoshitsugu Okuda, Masahiro Inoue (KEC), Hiro Shida (Tokin), Hisashi Ninomiya (Roland), Kenji Masaoka (KEC), Minoru Yamanaka (UL), Osami Wada (Kyo Dai) EMCJ2016-61 MW2016-93 EST2016-57		 In the previous report, we explained Round-Robin tests on radiated and conducted emission test research report/result. I... [more] EMCJ2016-61 MW2016-93 EST2016-57
pp.5-10
EMCJ 2015-09-04
15:10		 Kyoto Keihanna Plaza Results of EMC round robin test on emission and immunity test -- (1) Radiated and conducted emission tests --
Yoshitsugu Okuda (KEC), Yasushi Asaji (Murata), Chiaki Asaba (ADVANTEST), Mikio Okumura (OMRON), Hiro Shida (Tokin), Hisashi Ninomiya (Roland), Kenji Masaoka (KEC), Yoshihide Mimura (Intertek), Osami Wada (Kyodai) EMCJ2015-57		  [more] EMCJ2015-57
pp.25-30
 Results 1 - 5 of 5  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan