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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| SDM | 2023-01-30 14:55 |
Tokyo | Kikai-Shinko-Kaikan Bldg. B3-1 | [Invited Talk]
Design guidlines for SBD integration into SiC-MOSFET breaking RonA- diode conduction capability trade-off Shunsuke Asaba, Masaru Furukawa, Yuji Kusumoto (Toshiba D&S), Ryosuke Iijima (Toshiba), Hiroshi Kono (Toshiba D&S)  SDM2022-82 |
Degradation in performance due to the bipolar current through parasitic diode during reverse operation of SiC-MOSFET can... [more] | SDM2022-82 pp.13-16 |
| VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2017-11-08 09:25 |
Kumamoto | Kumamoto-Kenminkouryukan Parea | Real-time coefficient optimization method for PAM-4 transmitter equalizer Yosuke Iijima, Keigo Taya (NIT, Oyama college), Yasushi Yuminaka (Gunma Univ.) VLD2017-56 DC2017-62 |
Recently, demands for high-speed data transmission in electric wiring in a VLSI system are increasing with the advanceme... [more] | VLD2017-56 DC2017-62 pp.177-182 |
| ASN, IPSJ-UBI | 2013-05-16 14:45 |
Kumamoto | Kumamoto University | Development of a photovoltaic cell monitoring system using visible light PWM communication Yosuke Iijima, Fumihisa Kano (ONCT) ASN2013-10 |
[more] | ASN2013-10 pp.51-54 |
| VLD, CPSY, RECONF, DC, IPSJ-SLDM, IPSJ-ARC (Joint) [detail] |
2007-11-22 10:55 |
Fukuoka | Kitakyushu International Conference Center | Proposal of Optimization Design System for LDPC using FPGA Yukari Ishida, Hirotaka Nosato (Toho Univ.), Yosuke Iijima (Univ. of Tsukuba), Eiichi Takahashi (AIST), Tatsumi Furuya (Toho Univ.), Tetsuya Higuchi (AIST) RECONF2007-47 |
[more] | RECONF2007-47 pp.25-29 |
| VLD, CPSY, RECONF, DC, IPSJ-SLDM, IPSJ-ARC (Joint) [detail] |
2007-11-22 13:00 |
Fukuoka | Kitakyushu International Conference Center | Proposal for High-Speed Secure Network System using FPGA Hirotaka Nosato, Yukari Ishida (Toho Univ.), Yosuke Iijima (Univ. of Tsukuba), Eiichi Takahashi (AIST), Tatsumi Furuya (Toho Univ.), Tetsuya Higuchi (AIST) RECONF2007-49 |
[more] | RECONF2007-49 pp.37-42 |
| RECONF, CPSY, VLD, DC, IPSJ-SLDM, IPSJ-ARC (Joint) [detail] |
2006-11-30 09:50 |
Fukuoka | Kitakyushu International Conference Center | Development and evaluation of virus check system using FPGA Yukari Ishida (Toho Univ.), Yosuke Iijima (Univ.of Tsukuba), Eiichi Takahashi (AIST), Tatsumi Furuya (Toho Univ.), Tetsuya Higuchi (AIST) |
[more] | RECONF2006-45 pp.7-12 |
| RECONF | 2005-12-01 11:25 |
Fukuoka | Kitakyushu International Conference Center | Proposal of a virus check system using FPGA Kei Shimane (Toho Univ.), Yosuke Iijima (Univ. Of Tsukuba), Eiichi Takahashi (AIST), Tatsumi Furuya (Toho Univ.), Tetsuya Higuchi (AIST) |
As regular broadband connections to the Internet are now common in homes, private users need to take measures against va... [more] | RECONF2005-63 pp.25-30 |
| ICD, SDM | 2005-08-19 10:00 |
Hokkaido | HAKODATE KOKUSAI HOTEL | [Special Invited Talk]
HfSiON
-- its high applicability as the alternative gate dielectric based on the high thermal stability and the remaining issue -- Akira Nishiyama, Masato Koyama, Yuuichi Kamimuta, Masahiro Koike, Ryosuke Iijima, Takeshi Yamaguchi, Masamichi Suzuki, Tsunehiro Ino, Mizuki Ono (Toshiba) |
The decrease in the MOS device size has long been requiring the thinning of its gate dielectrics. In order to suppress t... [more] | SDM2005-146 ICD2005-85 pp.19-24 |
| ICD, SDM | 2005-08-19 10:45 |
Hokkaido | HAKODATE KOKUSAI HOTEL | HfSiON Gate Dielectrics Design for Mixed Signal CMOS Kenji Kojima, Ryosuke Iijima, Tatsuya Ohguro, Takeshi Watanabe, Mariko Takayanagi, Hisayo S. Momose, Kazunari Ishimaru, Hidemi Ishiuchi (TOSHIBA) |
(Advance abstract in Japanese is available) [more] | SDM2005-147 ICD2005-86 pp.25-30 |
| MW | 2005-06-28 15:40 |
Aichi | Proposal and evaluations for equivalent Circuit model of Stripline Yosuke Iijima (Univ. of Tsukuba), Yuji Kasai, Eiichi Takahashi, Tetsuya Higuchi (AIST) |
The characteristics of transmission lines are greatly influenced by skin effect and dielectric loss. It is therefore nec... [more] | MW2005-41 pp.51-56 |
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