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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
RECONF |
2022-06-07 16:55 |
Ibaraki |
CCS, Univ. of Tsukuba (Primary: On-site, Secondary: Online) |
Development of Vehicles GPS Time Synchronized Vibration Measurement System for Bridge Health Monitoring Masaaki Ono, Ryota Shin, Yukihiko Okada, Ryosuke Yamamoto (Univ. of Tsukuba) RECONF2022-12 |
(To be available after the conference date) [more] |
RECONF2022-12 pp.50-51 |
IE, ITS, ITE-AIT, ITE-HI, ITE-ME, ITE-MMS, ITE-CE [detail] |
2017-02-21 09:15 |
Hokkaido |
Hokkaido Univ. |
Measurement of Number of Vermin around a Cage Tatsuki Inada, Akie Yagura, Yosuke Yamamoto, Saori Hamaguchi, Kazufumi Nakai, Nobuo Ezaki (NIT Toba), Naoto Yamabata (Mie PAR), Osamu Takahashi (ISE) |
In recent years, damage to agricultural products by wild animals has become serious. Installing traps is the main method... [more] |
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ASN |
2015-11-05 11:20 |
Tokyo |
NICT Koganei HQ |
IoT for Agriculture "e-kakashi" Norio Yamaguchi, Takashi Togami, Kyosuke Yamamoto (PSSOL) ASN2015-58 |
[more] |
ASN2015-58 pp.5-8 |
ICD |
2012-12-18 11:45 |
Tokyo |
Tokyo Tech Front |
A 65 nm Low-Power Adaptive-Coupling Redundant Flip-Flop Masaki Masuda, Kanto Kubota, Ryosuke Yamamoto (KIT), Jun Furuta (Kyoto Univ.), Kazutoshi Kobayashi (KIT), Hidetoshi Onodera (Kyoto Univ.) ICD2012-117 |
We propose a low-power redundant flip-flop to be operated with high reliability over 1 GHz clock frequency based on the ... [more] |
ICD2012-117 pp.109-113 |
MRIS, ITE-MMS |
2012-10-19 08:55 |
Akita |
AIT |
[Invited Talk]
5Tb/in2 Bit Patterned Media Fabricated by a Directed Self-Assembling Polymer Mask Yoshiyuki Kamata, Tomoyuki Maeda, Hiroyuki Hieda, Ryosuke Yamamoto, Naoko Kihara, Akira Kikitsu (Toshiba corp.) MR2012-25 |
FePt bit patterned media (BPM) was fabricated with a self-assembled polymer mask with 12 nm pitch (equivalent to 5 Tdot/... [more] |
MR2012-25 pp.43-48 |
ICD |
2011-12-16 09:55 |
Osaka |
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A 65-nm Radiation-Hard Flip-Flop Tolerant to Multiple Cell Upsets Ryosuke Yamamoto, Chikara Hamanaka (Kyoto Inst. of Tech.), Jun Furuta (Kyoto Univ.), Kazutoshi Kobayashi (Kyoto Inst. of Tech.), Hidetoshi Onodera (Kyoto Univ.) ICD2011-129 |
MCUs in redundant FFs is a dominant factor in a current deep-submicron process. A layout structure to avoid MCUs is prop... [more] |
ICD2011-129 pp.131-136 |
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