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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
EID, ITE-IDY, IEE-EDD |
2012-01-28 10:18 |
Akita |
Akita University |
High Precision Measurement of Twist Elastic Constant K22 of LC Materials Based on the Ellipsometry Analysis Takahiro Ishinabe, Yuzuka Morita, Yuji Ohno (Tohoku Univ.), Tetsuya Miyashita (Tohoku Inst. of Tech), Tatsuo Uchida (Sendai Nat. College of Tech) EID2011-26 |
[more] |
EID2011-26 pp.63-66 |
ITE-IDY, EID, IEIJ-SSL, IEE-EDD |
2010-01-29 10:50 |
Fukuoka |
Kyusyu Univ. (Chikushi Campus) |
High-precision Measurement of the Threshold Voltage, the Elastic Constants Ratio and the Dielectric Constants Ratio of Liquid Crystal Materials Yusuke Chiba, Yuji Ohno, Takahiro Ishinabe, Tetsuya Miyashita, Tatsuo Uchida (Tohoku Univ.) EID2009-71 |
We devised a high-precision method of measuring the threshold voltage and the elastic and dielectric constants ratios of... [more] |
EID2009-71 pp.99-102 |
ITE-IDY, EID, IEIJ-SSL, IEE-EDD |
2010-01-29 11:00 |
Fukuoka |
Kyusyu Univ. (Chikushi Campus) |
Evaluation of the Temperature Dependence of Polar Anchoring Strength at the Surface of Alignment Layers in Liquid-crystal Devices Yuma Yoshita, Yuji Ohno, Takahiro Ishinabe, Tetsuya Miyashita, Tatsuo Uchida (Tohoku Univ.) EID2009-72 |
Understanding the dominant factor and the mechanism of the surface phenomenon is essential in analyzing the behavior of ... [more] |
EID2009-72 pp.103-106 |
OPE, MW |
2005-07-15 15:00 |
Niigata |
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A Fundamental Study on Wide-Band planarResonators Using Quasi-Lumped Elements
-- Use of Gap Capacitor and High-Impedance Inductive Line -- Takanobu Ohno, Yuji Ohno (Aoyama Gakuin Univ.), Koji Wada (The Univ. of Electro-Communications), Osamu Hashimoto (Aoyama Gakuin Univ.) |
Microstrip quasi-lumped elements such as gap capacitor and high-impedance inductive line are analyzed by an electromagne... [more] |
MW2005-61 OPE2005-45 pp.65-70 |
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