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Committee Date Time Place Paper Title / Authors Abstract Paper #
EMCJ, IEE-EMC 2012-12-14
15:15		 Gifu Gifu Univ. Estimation of the 3-port S Parameters with 2-port Measurements and Its Application to the Immunity Testing System
Noboru Maeda, Shinji Fukui (SOKEN), Kouji Ichikawa, Yukihiko Sakurai (DENSO), Toshikazu Sekine, Yasuhiro Takahashi (Gifu Univ.) EMCJ2012-98		 An estimation method of the three-port S parameters for the reciprocal circuit is presented. In this method, a known loa... [more] EMCJ2012-98
pp.81-85
EMCJ 2006-01-16
11:30		 Fukuoka Kyushu University S-parametesr Modeling Method for Immunity Noise Test Instrumentations
Masahito Hirayama, Noboru Maeda (SOKEN), Kouji Ichikawa, Masashi Inagaki, Yukihiko Sakurai (DENSO) 		 [more] EMCJ2005-128
pp.7-10
EMCJ 2004-12-10
16:15		 Aichi Nagoya Institute of Technology A Study on Measurement of LSI Immunity for PCB Analysis
Kouji Ichikawa, Yukihiko Sakurai, Masashi Inagaki, Takeshi Matsui (DENSO), Yuichi Mabuchi (Hitachi), Atsushi Nakamura, Toru Hayashi (Renesas Technology) 		We have been developing an LSI model for EMS simulation in automotive electronic control units.
PCB immunity was analyz... [more]		 EMCJ2004-115
pp.77-82
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