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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2009-12-04
13:00
Nara NAIST [Invited Talk] Temperature dependence of threshold voltage of High-k/Metal Gate MOSFETs
Yukio Nishida (Renesas/Hiroshima Univ.), Katsumi Eikyu, Akihiro Shimizu, Tomohiro Yamashita, Hidekazu Oda, Yasuo Inoue (Renesas), Kentaro Shibahara (Hiroshima Univ./Renesas) SDM2009-159
(Advance abstract in Japanese is available) [more] SDM2009-159
pp.43-47
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