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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| DC | 2021-02-05 10:30 |
Online | Online (Online) | A Study on a Method of Measuring Process Variations Considering the Effect of Wire Delay on FPGA Shingo Tsutsumi, Yukiya Miura (Tokyo Metropolitan Univ.)  DC2020-69 |
FPGAs are integrated circuits that can be implemented arbitrary logic functions. In FPGAs, it is important to measure pr... [more] | DC2020-69 pp.1-6 |
| DC | 2020-02-26 15:45 |
Tokyo | (Tokyo) | Frequency Variation of Ring Oscillators During Long-Time Operation on FPGA Shingo Tsutsumi, Yukiya Miura (Tokyo Metropolitan Univ.) DC2019-95 |
FPGAs (Field Programmable Gate Arrays) are integrated circuits that can be implemented arbitrary logic functions by reco... [more] | DC2019-95 pp.55-60 |
| DC | 2020-02-26 16:35 |
Tokyo | (Tokyo) | Soft Error Tolerance of Power-Supply-Noise Hardened Latches Yuya Kinoshita, Yukiya Miura (Tokyo Metropolitan Univ.) DC2019-97 |
In recent years, with the scaling down and low-power operation of VLSI circuits, reliability degradation due to soft err... [more] | DC2019-97 pp.67-72 |
| DC | 2019-12-20 16:30 |
Wakayama | (Wakayama) | Aging Observation using On-Chip Delay Measurement in Long-term Reliability Test Yousuke Miyake, Takaaki Kato, Seiji Kajihara (Kyutech), Masao Aso, Haruji Futami, Satoshi Matsunaga (Syswave), Yukiya Miura (TMU) DC2019-85 |
Avoidance of delay-related faults due to aging phenomena is an important issue of VLSI systems. Periodical delay measure... [more] | DC2019-85 pp.37-42 |
| DC | 2019-02-27 15:35 |
Tokyo | Kikai-Shinko-Kaikan Bldg. (Tokyo) | Improvement of Flip-Flop Performance Considering the Influence of Power Supply Noise Yuya Kinoshita, Yukiya Miura (Tokyo Metropolitan Univ.) DC2018-82 |
With the scaling down and low-power operation of VLSI circuits, influence on circuit behavior by power supply noise such... [more] | DC2018-82 pp.67-72 |
| DC | 2018-02-20 15:30 |
Tokyo | Kikai-Shinko-Kaikan Bldg. (Tokyo) | Investigation of a Measurement Method of Characteristic Variations in the FPGA Considering an LUT Structure Kouhei Satou, Yukiya Miura (Tokyo Metropolitan Univ.) DC2017-86 |
FPGAs (Field Programmable Gate Arrays) are integrated circuits that can implement arbitrary logic functions by reconfigu... [more] | DC2017-86 pp.55-60 |
| DC | 2018-02-20 16:35 |
Tokyo | Kikai-Shinko-Kaikan Bldg. (Tokyo) | Influence on Flip-Flop Behaviors by Power Supply Noise and Proposal of their Countermeasures Miyuki Inoue, Yukiya Miura (Tokyo Metropolitan Univ.) DC2017-88 |
With the scaling down and low power operation of VLSI circuits, effects on circuit behavior by power supply noise such a... [more] | DC2017-88 pp.67-72 |
| DC | 2017-02-21 16:10 |
Tokyo | Kikai-Shinko-Kaikan Bldg. (Tokyo) | Considerations on Characteristics of Ring Oscillators Implemented in FPGA Kouhei Satou, Yukiya Miura (Tokyo Metropolitan Univ.) DC2016-82 |
FPGAs (Field Programmalbe Gate Arrays) are integrated circuits that can be implemented arbitrary logic functions by reco... [more] | DC2016-82 pp.45-52 |
| DC | 2016-02-17 16:05 |
Tokyo | Kikai-Shinko-Kaikan Bldg. (Tokyo) | Study on the Effect of Power Supply Noise on Flip-Flop Circuits Takuya Yamamoto, Yukiya Miura (Tokyo Metropolitan Univ.) DC2015-96 |
According to the scaling down, and lower power design of VLSI circuits, power supply noise such as IR-drop affects the o... [more] | DC2015-96 pp.61-66 |
| DC | 2014-06-20 13:15 |
Tokyo | Kikai-Shinko-Kaikan Bldg. (Tokyo) | Development of a delay time measurement circuit by inserting buffers Takuya Yamamoto, Yukiya Miura (Tokyo Metropolitan Univ.) DC2014-10 |
According to the scaling down, lower power design, and highly operational frequency of the device, the process variabili... [more] | DC2014-10 pp.1-6 |
| DC | 2014-06-20 13:40 |
Tokyo | Kikai-Shinko-Kaikan Bldg. (Tokyo) | A method of LSI degradation estimation using ring oscillators Tatsunori Ikeda, Yukiya Miura (Tokyo Metropolitan Univ.) DC2014-11 |
Aging called Negative Bias Temperature Instability (NBTI), Negative Bias Temperature Instability (NBTI) and Chanel Hot C... [more] | DC2014-11 pp.7-14 |
| DC | 2013-06-21 16:30 |
Tokyo | Kikai-Shinko-Kaikan Bldg. (Tokyo) | A Method of Transistor Degradation Estimation Using Ring Oscillators Tatsunori Ikeda, Yukiya Miura (Tokyo Metropolitan Univ.) DC2013-15 |
Aging called Negative Bias Temperature Instability (NBTI), Negative Bias Temperature Instability (NBTI) and Chanel Hot C... [more] | DC2013-15 pp.31-36 |
| DC | 2013-02-13 16:15 |
Tokyo | Kikai-Shinko-Kaikan Bldg. (Tokyo) | Temperature and voltage estimation considering manufacturing variability for a monitoring circuit Yousuke Miyake, Wataru Tsumori, Yasuo Sato, Seiji Kajihara (Kyushu Inst. of Tech.), Yukiya Miura (Tokyo Metropolitan Univ.) DC2012-89 |
Delay increase due to aging phenomena is a critical issue of VLSIs. For detecting such increase in field, a highly accur... [more] | DC2012-89 pp.55-60 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2012-11-28 14:30 |
Fukuoka | Centennial Hall Kyushu University School of Medicine (Fukuoka) | Design of temperature and voltage monitoring circuit structure for field test Wataru Tsumori, Yousuke Miyake, Yasuo Sato, Seiji Kajihara (KIT), Yukiya Miura (TMU) VLD2012-101 DC2012-67 |
For improving reliability of LSIs, the delay increase caused by aging during system operation should be detected before ... [more] | VLD2012-101 DC2012-67 pp.243-248 |
| DC | 2012-06-22 16:35 |
Tokyo | Room B3-1 Kikai-Shinko-Kaikan Bldg (Tokyo) | Evaluation of the on-chip temperature and voltage using ring-oscillator-based monitoring circuit and a study for an application to field test Yousuke Miyake, Takuma Sasakawa, Yasuo Sato, Seiji Kajihara (Kyutech), Yukiya Miura (TMU) DC2012-16 |
Delay increase due to aging phenomena is a critical issue of VLSIs. For detecting such increase in field, highly accurat... [more] | DC2012-16 pp.45-50 |
| DC | 2012-02-13 10:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg. (Tokyo) | Design of Dual Edge Triggered Flip-Flops and Application to Signal Delay Detection Yoshihiro Ohkawa, Yukiya Miura (TMU) DC2011-76 |
Conventional edge triggered flip-flops sample a data signal synchronizing with single clock edge. If a noise signal occu... [more] | DC2011-76 pp.1-6 |
| DC | 2012-02-13 16:20 |
Tokyo | Kikai-Shinko-Kaikan Bldg. (Tokyo) | Evaluation of a thermal and voltage estimation circuit for field test Yousuke Miyake, Yasuo Sato, Seiji Kajihara, Kohei Miyase (Kyutech), Yukiya Miura (TMU) DC2011-86 |
High dependability is required for an embedded system VLSI. High functionality and high performance of VLSI, due to the ... [more] | DC2011-86 pp.61-66 |
| DC | 2011-02-14 15:40 |
Tokyo | Kikai-Shinko-Kaikan Bldg. (Tokyo) | Dual Edge Triggered Flip-Flops for Blocking Noise Pulses on Data Signal Lines Yukiya Miura (Tokyo Metropolitan Univ.) DC2010-68 |
This paper proposes a new flip-flop design, a dual edge triggered flip-flops, for dependable design taking into account ... [more] | DC2010-68 pp.57-62 |
| ICD (Workshop) |
2010-08-16 - 2010-08-18 |
Overseas | Ho Chi Minh City University of Technology (Overseas) | [Invited Talk]
Circuit Failure Prediction by Field Test (DART) with Delay-Shift Measurement Mechanism Yasuo Sato, Seiji Kajihara (Kyusyu Institute of Technology), Michiko Inoue, Tomokazu Yoneda, Satoshi Ohtake, Hideo Fujiwara (NAIST), Yukiya Miura (Tokyo Metropolitan Univ.) |
The main task of test had traditionally been screening of hard defects before shipping. However, current chips are takin... [more] | |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2009-12-04 14:25 |
Kochi | Kochi City Culture-Plaza (Kochi) | A Path Selection Method of Delay Test for Transistor Aging Mitsumasa Noda (Kyushu Institute of Tech.), Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen (Kyushu Institute of Tech./JST), Yukiya Miura (Tokyo Metropolitan Univ./JST) VLD2009-65 DC2009-52 |
With the advanced VLSI process technology, it is important for reliability of VLSIs to deal with faults caused by aging.... [more] | VLD2009-65 DC2009-52 pp.167-172 |
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