IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 5 of 5  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2012-11-27
09:00
Fukuoka Centennial Hall Kyushu University School of Medicine [Invited Talk] High-Speed Interconnect Technologies
Yutaka Uematsu, Go Shinkai, Satoshi Muraoka, Masayoshi Yagyu, Hideki Osaka (Hitachi) CPM2012-112 ICD2012-76
 [more] CPM2012-112 ICD2012-76
pp.1-6
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2012-11-28
11:20
Fukuoka Centennial Hall Kyushu University School of Medicine High Sensitive Detection of Low S/N ratio Signal by Bistable Potential Circuit
Hisaaki Kanai, Wen Li, Kengo Imagawa, Masami Makuuchi, Yutaka Uematsu, Hideki Osaka (Hitachi, Ltd.) VLD2012-93 DC2012-59
Stochastic resonance (SR), a phenomenon that signals can be enhanced with especial noise strength in a non-linear system... [more] VLD2012-93 DC2012-59
pp.195-200
EMCJ 2009-11-20
13:55
Tokyo Aoyama Gakuin Univ. (Aoyama Campus) Measurement Techniques for On-chip Power Supply Noise Waveforms based on Delay Observation in Inverter Chain Circuits
Yutaka Uematsu, Hideki Osaka, Eiichi Suzuki, Masayoshi Yagyu, Tatsuya Saito (Hitachi Co Ltd.) EMCJ2009-83
To evaluate an on-chip power supply noise waveforms for power integrity design, we have developed a
technique for measu... [more]
EMCJ2009-83
pp.25-30
EMCJ 2009-11-20
14:20
Tokyo Aoyama Gakuin Univ. (Aoyama Campus) PDN Analysis of LSI Package in Short TAT using TMM and Approximated Equivalent Circuit
Masahiro Toyama, Yutaka Uematsu, Hideki Osaka (Hitachi,LTD.), Motoo Suwa, Atsushi Nakamura (Renesas Tech Corp.) EMCJ2009-84
For the efficient optimizing of LSI package PDN (Power Distribution Network) in early stage of the design, short TAT ana... [more] EMCJ2009-84
pp.31-36
CPM, ICD 2008-01-18
10:30
Tokyo Kikai-Shinko-Kaikan Bldg A Method for Measuring Vref Noise Tolerance of DDR2-SDRAM on Test Board that Simulates Memory Module
Yutaka Uematsu, Hideki Osaka (Hitachi), Yoji Nishio, Susumu Hatano (Elpida) CPM2007-139 ICD2007-150
Aiming to achieve double data rate-synchronous DRAM (DDR-SDRAM) at low-cost and with high noise tolerance by setting ade... [more] CPM2007-139 ICD2007-150
pp.65-69
 Results 1 - 5 of 5  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan