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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2012-11-27 09:00 |
Fukuoka |
Centennial Hall Kyushu University School of Medicine |
[Invited Talk]
High-Speed Interconnect Technologies Yutaka Uematsu, Go Shinkai, Satoshi Muraoka, Masayoshi Yagyu, Hideki Osaka (Hitachi) CPM2012-112 ICD2012-76 |
[more] |
CPM2012-112 ICD2012-76 pp.1-6 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2012-11-28 11:20 |
Fukuoka |
Centennial Hall Kyushu University School of Medicine |
High Sensitive Detection of Low S/N ratio Signal by Bistable Potential Circuit Hisaaki Kanai, Wen Li, Kengo Imagawa, Masami Makuuchi, Yutaka Uematsu, Hideki Osaka (Hitachi, Ltd.) VLD2012-93 DC2012-59 |
Stochastic resonance (SR), a phenomenon that signals can be enhanced with especial noise strength in a non-linear system... [more] |
VLD2012-93 DC2012-59 pp.195-200 |
EMCJ |
2009-11-20 13:55 |
Tokyo |
Aoyama Gakuin Univ. (Aoyama Campus) |
Measurement Techniques for On-chip Power Supply Noise Waveforms based on Delay Observation in Inverter Chain Circuits Yutaka Uematsu, Hideki Osaka, Eiichi Suzuki, Masayoshi Yagyu, Tatsuya Saito (Hitachi Co Ltd.) EMCJ2009-83 |
To evaluate an on-chip power supply noise waveforms for power integrity design, we have developed a
technique for measu... [more] |
EMCJ2009-83 pp.25-30 |
EMCJ |
2009-11-20 14:20 |
Tokyo |
Aoyama Gakuin Univ. (Aoyama Campus) |
PDN Analysis of LSI Package in Short TAT using TMM and Approximated Equivalent Circuit Masahiro Toyama, Yutaka Uematsu, Hideki Osaka (Hitachi,LTD.), Motoo Suwa, Atsushi Nakamura (Renesas Tech Corp.) EMCJ2009-84 |
For the efficient optimizing of LSI package PDN (Power Distribution Network) in early stage of the design, short TAT ana... [more] |
EMCJ2009-84 pp.31-36 |
CPM, ICD |
2008-01-18 10:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg |
A Method for Measuring Vref Noise Tolerance of DDR2-SDRAM on Test Board that Simulates Memory Module Yutaka Uematsu, Hideki Osaka (Hitachi), Yoji Nishio, Susumu Hatano (Elpida) CPM2007-139 ICD2007-150 |
Aiming to achieve double data rate-synchronous DRAM (DDR-SDRAM) at low-cost and with high noise tolerance by setting ade... [more] |
CPM2007-139 ICD2007-150 pp.65-69 |
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