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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM, VLD 2007-10-31
14:15
Tokyo Kikai-Shinko-Kaikan Bldg. The Analysis of MOSFET Characteristic Fluctuation Caused by Layout Variation
Kunio Anzai, Hitoshi Tsuno, Masao Matsumura, Satoe Minami, Yohei Hiura, Akira Takeo, Fu Wingsze, Yuzo Fukuzaki, Michihiro Kanno, Naoki Nagashima, Hisahiro Ansai (Sony) VLD2007-66 SDM2007-210
 [more] VLD2007-66 SDM2007-210
pp.31-34
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