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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| NC, NLP | 2023-01-29 11:45 |
Hokkaido | Future University Hakodate (Primary: On-site, Secondary: Online) |
Regulation of insulin secretion by ATP-sensitive K+ channel in pancreatic beta cells and paracrine effects of pancreatic alpha and delta cells Ryusei Hayakawa, Shinji Doi (Kyoto Univ)  NLP2022-99 NC2022-83 |
Pancreatic $beta$ cells in the pancreatic islets control the blood glucose level by insulin secretion. Insulin secretion... [more] | NLP2022-99 NC2022-83 pp.99-104 |
| DC | 2022-03-01 14:45 |
Tokyo | Kikai-Shinko-Kaikan Bldg. (Primary: On-site, Secondary: Online) |
SAT-based LFSR Seed Generation for Delay Fault BIST Kotaro Iwamoto, Satoshi Ohtake (Oita Univ.) DC2021-74 |
So far, a one-pass LFSR seed generation method for delay fault BIST has been proposed. The method directly generates see... [more] | DC2021-74 pp.57-62 |
| NC, NLP (Joint) |
2021-01-21 16:25 |
Online | Online | Modulation of the electrical activity of pancreatic alpha cells by their intrinsic mechanisms and by paracrine effects from pancreatic beta cells Yuto Nishide, Shinji Doi (Kyoto Univ.) NLP2020-47 |
The $alpha$-cells in the pancreatic islets are electrically excitable and secrete glucagon in response to low blood gluc... [more] | NLP2020-47 pp.36-41 |
| DC | 2019-12-20 14:45 |
Wakayama | Examination of safety evaluation method of railway signal system
-- Combined use of FMEA, FTA and STPA -- Yukiko Sugimoto, Tomoki Kobayashi, Ryota Kouzuki, Naohiro Morishima (Kyosan), Takeshi Mizuma, Upvinder Singh, Maheshuni Shiva Krishna (Univ. of Tokyo) DC2019-81 |
The safety evaluation method for railway signal systems was examined and it was judged that the combination use of FMEA,... [more] | DC2019-81 pp.17-20 |
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| IPSJ-SLDM, RECONF, VLD, CPSY, IPSJ-ARC [detail] | 2019-01-30 11:20 |
Kanagawa | Raiosha, Hiyoshi Campus, Keio University | An Incremental Automatic Test Pattern Generation Method for Multiple Stuck-at Faults Peikun Wang, Amir Masoud Gharehbaghi, Masahiro Fujita (UTokyo) VLD2018-74 CPSY2018-84 RECONF2018-48 |
This paper proposes an incremental ATPG method to deal with multiple stuck-at faults. In order to generate the test set ... [more] | VLD2018-74 CPSY2018-84 RECONF2018-48 pp.13-18 |
| VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2018-12-06 13:50 |
Hiroshima | Satellite Campus Hiroshima | Study on the Applicability of ATPG Pattern for DFT Circuit Kohki Taniguchi, Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.) VLD2018-58 DC2018-44 |
With high integration of IC, small delay faults have occurred as the cause of a circuit failure. As a design-for-testabi... [more] | VLD2018-58 DC2018-44 pp.131-136 |
| R | 2017-07-28 13:35 |
Hokkaido | Wakkanai Sun Hotel | A Practical Use of GNSS for a Train Protection System and its Reliability Akira Asano (Kyosan), Hiroshi Mochizuki, Hideo Nakamura (Nihon Univ.) R2017-16 |
Satellite positioning technology on the basis of Global Navigation Satellite Systems (GNSS), which are represented by Gl... [more] | R2017-16 pp.13-18 |
| VLD, CAS, MSS, SIP | 2016-06-16 10:10 |
Aomori | Hirosaki Shiritsu Kanko-kan | Automatic Test Pattern Generation for Multiple Stuck-At Faults: When Testing for Single Faults is Insufficient Conrad JinYong Moore, Amir Masoud Gharehbaghi, Masahiro Fujita (Univ. of Tokyo) CAS2016-3 VLD2016-9 SIP2016-37 MSS2016-3 |
As fabricated circuitry gets larger and denser, modern industrial ATPG techniques which focus on the detection of single... [more] | CAS2016-3 VLD2016-9 SIP2016-37 MSS2016-3 pp.13-18 |
| SSS | 2016-05-19 15:50 |
Tokyo | An Architectue of a Unified Train Control System and its Safety Yoshihisa Saitou, Akira Asano (Kyosan), Hideo Nakamura, Sei Takahashi, Hirishi Mochizuki (Nihon Univ.) SSS2016-5 |
A conventional train control system assures the safety owing to the collaboration works between an interlocking subsyste... [more] | SSS2016-5 pp.19-22 |
|
| DC | 2016-02-17 10:50 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Reduction of open fault test pattern generation time by selection of adjacent lines for assigning logic value Kazui Fujitnai, Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.), Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.) DC2015-88 |
As semiconductor technology is scaling down, open defects have often occurred at interconnect lines and vias. If logic v... [more] | DC2015-88 pp.13-18 |
| MBE, NC (Joint) |
2014-12-13 14:20 |
Aichi | Nagoya University | Observation of microbial contamination on infusion pump and comparison of wipe and disinfection for removing microbial pollution Atsushi Saito (HUS), Yasushi Makka (HUS/Sapporo Hokushin HP), Toshitsugu Sugawara, Satoshi Kuroda, Junji Arisawa, Kazuyuki Kimura (HUS) MBE2014-86 |
An infusion pump is medical equipment required for medication of an antineoplastic drug or precise infusion. On the othe... [more] | MBE2014-86 pp.69-73 |
| NS, IN (Joint) |
2013-03-07 11:10 |
Okinawa | Okinawa Zanpamisaki Royal Hotel | Performance analysis of a message transfer via street pass communication Shunsuke Kishi, Naoshi Sakamoto (Tokyo Denki Univ.) NS2012-180 |
Recently, since terminals with personal area network such as bluetooth are spreading, StreetPass communication has come ... [more] | NS2012-180 pp.89-94 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2012-11-27 13:00 |
Fukuoka | Centennial Hall Kyushu University School of Medicine | Effective Orderings of Instances and Variable Assignments in SAT-based ATPG with Solution Reuse Kenji Ueda, Tsuyoshi Iwagaki, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.) VLD2012-83 DC2012-49 |
This report discusses the efficiency of iteratively solving various instances with solution reuse in test generation ba... [more] |
VLD2012-83 DC2012-49 pp.141-146 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2012-11-28 16:00 |
Fukuoka | Centennial Hall Kyushu University School of Medicine | A Method to Estimate the Number of Don't-Care Bits with Netlist Kohei Miyase, Seiji Kajihara, Xiaoqing Wen (KIT) VLD2012-104 DC2012-70 |
X-filling is often utilized so as to achieve test compression, test power reduction, or test quality improvement etc. i... [more] |
VLD2012-104 DC2012-70 pp.261-266 |
| MBE | 2012-01-27 15:55 |
Fukuoka | Kyushu University | Relationships between surface damage of medical equipments and keeping ability of bacteria examined by ATP assay Sho Nagai, Toshitsugu Sugawara, Satoshi Kuroda, Junji Arisawa (HIT), Kanae Hashimoto (Obihiro-Kosei General Hospital), Kazuyuki Kimura (HIT) MBE2011-89 |
Cross infection associated medical equipments is an important problem about the healthcare associate infection. For prot... [more] | MBE2011-89 pp.53-58 |
| DC | 2011-12-16 14:30 |
Hyogo | A Safety Estimation of the ATPB System using UML and Formal Method Guo Xie, Hiroshi Mochizuki, Sei Takahashi, Hideo Nakamura (Nihon Univ.) DC2011-70 |
This paper models and makes a formal analysis of the train control system of a novel railway system, ATPB system, which ... [more] | DC2011-70 pp.13-16 |
|
| NC, MBE (Joint) |
2011-03-07 17:25 |
Tokyo | Tamagawa University | Signal transduction mechanisms for the regulation of ATP release during ischemia in cardiomyocytes Satohiko Kunugi, Sadahiro Iwabuchi, Daisuke Matsuyama, Koichi Kawahara (Hokkaido Univ.) MBE2010-112 |
A variety of cellular mechanisms are involved in the release of intracellular ATP in cardiomyocytes. It is reported that... [more] | MBE2010-112 pp.53-56 |
| DC | 2011-02-14 10:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Capture-Safety Checking Based on Transition-Time-Relation for At-Speed Scan Test Vectors Ryota Sakai, Kohei Miyase, Xiaoqing Wen (Kyushu Inst. of Tech.), Masao Aso, Hiroshi Furukawa (RMS), Yuta Yamato (Fukuoka Ind. Sci & Tech/Fundation FIST), Seiji Kajihara (Kyushu Inst. of Tech.) DC2010-60 |
Excessive capture power in at-speed scan testing may cause timing failures, resulting in test-induced yield loss. This h... [more] | DC2010-60 pp.7-12 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2009-12-03 14:05 |
Kochi | Kochi City Culture-Plaza | Optimizing Don't-Care Bit Rate Derived from X-Identification for Reduction of Switching Activity Isao Beppu (Kyushu Institute of Tech), Kohei Miyase (Kyushu Institute of Tech/JST), Yuta Yamato (Kyushu Institute of Tech), Xiaoqing Wen, Seiji Kajihara (Kyushu Institute of Tech/JST) VLD2009-55 DC2009-42 |
Increase of power dissipation and IR-drop during scan-shifting operation and/or capture operation is still challenging p... [more] | VLD2009-55 DC2009-42 pp.95-100 |
| MBE | 2009-06-26 13:30 |
Hokkaido | Hokkaido Univ. | Mechanisms involved in the regulation of ATP release during ischemia and ischemia/reperfusion injury in cultured cardiomyocytes Satohiko Kunugi, Daisuke Matsuyama, Sadahiro Iwabuchi, Koichi Kawahara (Hokkaido Univ.) MBE2009-13 |
It is known that pannexin or connexin hemichannels and maxi-anion channels work as primary ATP release pathways in many ... [more] | MBE2009-13 pp.1-4 |
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