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 Results 1 - 6 of 6  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] 2023-11-17
15:40		 Kumamoto Civic Auditorium Sears Home Yume Hall
(Primary: On-site, Secondary: Online)		 VLD2023-79 ICD2023-87 DC2023-86 RECONF2023-82 Muller’s C-element is a basic component often used to rendezvous signals in asynchronous circuit designs. A lot of imple... [more] VLD2023-79 ICD2023-87 DC2023-86 RECONF2023-82
pp.255-260
DC, CPSY, IPSJ-ARC [detail] 2020-10-12
14:10		 Online Online Soft error tolerant SR latch using C-element
Ibuki Nakata, Kazuteru Namba (Chiba Univ) CPSY2020-19 DC2020-19		 VLSI systems have become downsized, high integrated and low-power. As a result, the incidence of soft errors is increasi... [more] CPSY2020-19 DC2020-19
pp.12-15
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]		 2015-12-03
13:45		 Nagasaki Nagasaki Kinro Fukushi Kaikan Evaluation of Low-Voltage Characteristics of QDI model based Asynchronous VLSI
Ryuhei Tachika, Atsushi Kurokawa, Masashi Imai (Hirosaki Univ.) VLD2015-67 DC2015-63		 In synchronous circuits, it is needed to distribute an identical clock signal to the whole chip with a constant frequenc... [more] VLD2015-67 DC2015-63
pp.189-194
DC 2010-06-25
13:30		 Tokyo Kikai-Shinko-Kaikan Bldg. A Full Scan Design Method for Asynchronous Sequential Circuits Based on C-element Scan Paths
Hiroshi Iwata, Satoshi Ohtake, Michiko Inoue, Hideo Fujiwara (NAIST) DC2010-8		 Using asynchronous VLSI designs resolve synchronous circuit design difficulties, e.g.\ the clock skew, higher throughput... [more] DC2010-8
pp.1-6
DC, CPSY 2010-04-13
15:40		 Tokyo   BILBO FF with soft error correcting capability
Kazuteru Namba, Hideo Ito (Chiba Univ.) CPSY2010-4 DC2010-4		 This paper presents a construction of a flip-flop (FF) that works as a soft error correcting FF in system operations and... [more] CPSY2010-4 DC2010-4
pp.15-20
DC, CPSY 2008-04-23
16:15		 Tokyo Tokyo Univ. Soft Error Hardened FF Capable of Detecting Wide Error Pulse
Shuangyu Ruan, Kazuteru Namba, Hideo Ito (Chiba-Univ.) CPSY2008-9 DC2008-9		 In the recent high-density and low-power VLSIs，occurrence of soft errors becomes significant problems．Recently，soft erro... [more] CPSY2008-9 DC2008-9
pp.49-54
 Results 1 - 6 of 6  /   
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