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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 13 of 13  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD, HWS 2023-10-31
15:00
Mie  
(Primary: On-site, Secondary: Online)
Side-Channel Leakage Evaluation of 3D CMOS Chip Stacking
Kazuki Monta, Rikuu Hasegawa, Takuji Miki, Makoto Nagata (Kobe Univ.) HWS2023-57 ICD2023-36
2.5D and 3D packaging are methodologies that include multiple integrated circuit (IC) chips. They deliver enhanced perfo... [more] HWS2023-57 ICD2023-36
pp.16-19
HWS, VLD 2023-03-04
14:20
Okinawa
(Primary: On-site, Secondary: Online)
Side-channel Information Leakage Resistance Evaluation of Cryptographic Multi- chip Modules
Takumi Matsumaru, Kazuki Monta (Kobe Univ.), Takaaki Okidono (SCU), Takuzi Miki, Makoto Nagata (Kobe Univ.) VLD2022-122 HWS2022-93
Demand for multi-chip packaging technology is rising. This study focuses on two types of packaging technologies in parti... [more] VLD2022-122 HWS2022-93
pp.273-278
HWS, ICD [detail] 2021-10-19
11:15
Online Online High-Efficiency simulation method for evaluating power noise and side-channel leakage in crypto modules
Kazuki Monta, Takuji Miki, Makoto Nagata (Kobe Univ.) HWS2021-44 ICD2021-18
In semiconductor integrated circuits of cryptographic modules, the side-channel leakage from power supply noise is criti... [more] HWS2021-44 ICD2021-18
pp.19-22
HWS, VLD [detail] 2020-03-07
13:25
Okinawa Okinawa Ken Seinen Kaikan
(Cancelled but technical report was issued)
Side-channel leakage evaluation of cryptographic module by IC chip level power supply noise simulation
Kazuki Yasuda, Kazuki Monta, Akihiro Tsukioka, Noriyuki Miura, Makoto Nagata (Kobe Univ), Karthik Srinivasan, Shan Wan, Lagn Lin, Ying-Shiun Li, Norman Chang (ANSYS) VLD2019-142 HWS2019-115
In this research, we focused on power supply noise as one of the observed side channel information leakage in cryptograp... [more] VLD2019-142 HWS2019-115
pp.279-282
ISEC, SITE, ICSS, EMM, HWS, BioX, IPSJ-CSEC, IPSJ-SPT [detail] 2019-07-23
13:35
Kochi Kochi University of Technology Side-channel leakage evaluation of cryptographic module by IC chip level consumption simulation
Kazuki Yasuda, Kazuki Monta, Akihiro Tsukioka, Noriyuki Miura, Makoto Nagata (Kobe Univ.) ISEC2019-27 SITE2019-21 BioX2019-19 HWS2019-22 ICSS2019-25 EMM2019-30
With the development of the information society, side-channel information leakage due to power supply noise in a cryptog... [more] ISEC2019-27 SITE2019-21 BioX2019-19 HWS2019-22 ICSS2019-25 EMM2019-30
pp.139-143
ISEC 2013-12-11
14:55
Tokyo Kikai-Shinko-Kaikan Bldg. The Process by which Faults are Injected on Smart Cards Attacked by an Electromagnetic Irradiation Experiment
Yuu Tsuchiya, Hitoshi Ono, Tsutomu Matsumoto (Yokohama National Univ.) ISEC2013-77
Fault injection attack, inducing partial fault in a cryptographic module and extracting the inside key, has been conside... [more] ISEC2013-77
pp.25-31
EMCJ, IEE-EMC 2012-12-14
15:35
Gifu Gifu Univ. Safety Estimates of Cryptographic Modules against On-Board Side-Channel Attacks by Use of EMC Macro-Model
Kengo Iokibe, Tetsuo Amano, Kaoru Okamoto, Yoshitaka Toyota (Okayama Univ.), Tetsushi Watanabe (Ind Tech. Center of Okayama Prefecture) EMCJ2012-99
In this study, EMC-macro modeling was examined to develop a method to evaluate cryptographic systems before fabrication.... [more] EMCJ2012-99
pp.87-94
ISEC, LOIS 2012-11-21
14:15
Shizuoka Shizuoka City Industry-University Exchange Center How to Extract AES Key from Smart Card by Fault Injection Attack Using Electromaginetic Irradiataion
Yuu Tsuchiya, Takeshi Kishikawa, Shohei Saito, Tsuyoshi Toyama (YNU), Akihiko Sasaki (MORITA TECH), Akashi Satoh (VDEC, Univ. Tokyo), Tsutomu Matsumoto (YNU) ISEC2012-57 LOIS2012-32
Fault injection attack, inducing partial fault in a cryptographic module and extracting the inside key, has been conside... [more] ISEC2012-57 LOIS2012-32
pp.1-8
ISEC 2012-09-21
17:05
Tokyo Kikai-Shinko-Kaikan Bldg. An Efficient Method of Strictly Evaluating Side-Channel Security
Takeshi Kishikawa, Shohei Saito, Yuu Tsuchiya, Tsuyoshi Toyama, Tsutomu Matsumoto (Yokohama Nat'l Univ.) ISEC2012-56
Evaluation of side-channel security, i.e., resistance against side-channel attacks of cryptographic modules is definitel... [more] ISEC2012-56
pp.67-74
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2010-12-01
10:10
Fukuoka Kyushu University Magnetic Field Measurement for Side-channel Analysis Environment
Toshihiro Katashita, Yohei Hori, Akashi Satoh (AIST) RECONF2010-46
Cryptography used widely in electronic products is evaluated in terms of computationally-secure, however there is vulner... [more] RECONF2010-46
pp.43-48
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2009-12-03
15:40
Kochi Kochi City Culture-Plaza Development of Standard Evaluation Environment for Side-channel Attacks and Countermeasures
Toshihiro Katashita (AIST), Yohei Hori (Chuo Univ.), Akashi Satoh (AIST) RECONF2009-46
Cryptography used widely in electronic products is evaluated in terms of computationally-secure, however there is vulner... [more] RECONF2009-46
pp.31-36
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2008-11-18
15:20
Fukuoka Kitakyushu Science and Research Park Development of Side-channel Attack Standard Evaluation BOard and Tool
Yohei Hori, Toshihiro Katashita, Hirofumi Sakane, Kenji Toda, Akashi Satoh (National Institute of Advanced Industrial Science and Technology), Hideki Imai (Chuo Univ.) RECONF2008-54
Side-channel Attack Standard Evaluation BOards (SASEBO) and their
analysis tools are developed to provide uniform exp... [more]
RECONF2008-54
pp.87-92
PN, CS, OCS
(Joint)
2008-06-13
16:30
Hokkaido Chitose Institute of Science and Technology Fast Quantum Cryptography System using Single Photon Communication
Akio Tajima, Akihiro Tanaka, Yosihiro Nambu, Wakako Maeda, Ken-ichiro Yoshino, Seigo Takahashi, Akihisa Tomita (NEC) OCS2008-19
Quantum key distribution (QKD) systems based on single photon transmission can generate unconditionally secure common ke... [more] OCS2008-19
pp.51-56
 Results 1 - 13 of 13  /   
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