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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 67  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
ED 2022-12-09
14:35
Aichi 12/8 Nagoya University, 12/9 WINC AICHI Optimal Design of Attenuator for Helix-TWTs by Using 3D Numerical Simulations
Kenji Nakajima (GSST/NECSpace/NETS), Kunio Tsutaki (RIE Shizuoka Univ.), Yoichiro Neo, Hidenori Mimura (RIE Shizuoka Univ./GSST Shizuoka Univ.) ED2022-66
With the recent advancement of communication capacity and speed, traveling wave tubes (TWT), that are used as final stag... [more] ED2022-66
pp.51-54
SIS 2022-12-05
14:50
Osaka
(Primary: On-site, Secondary: Online)
A Method of Automatic Wall Detection from Room Images by Deep Neural Networks
Shunya Shimegi, Kaoru Arakawa (Meiji Univ.) SIS2022-27
In order to design interior renovation easily,a method of automatic wall area detection is proposed using deep neural ne... [more] SIS2022-27
pp.21-25
ICM 2021-03-18
09:25
Online Online [Encouragement Talk] An Automation Technology of Testing Environment Configuration for ICT System Products by Search-based System Design Generation Scheme
Kazuki Tanabe, Takayuki Kuroda, Kozo Satoda (NEC) ICM2020-60
In this paper, we propose an automation technology to generate comprehensive testing environments for performance evalua... [more] ICM2020-60
pp.7-12
COMP 2020-12-04
09:30
Online Online Counting Weave Diagrams
Tomio Hirata (Nagoya Univ.), Isamu Matsuura (Aichi Center for Industry and Science Technology) COMP2020-18
Usually, a woven fabric is constructed by repeating a small pattern unit up down and left right like tiling. We call suc... [more] COMP2020-18
pp.1-7
ET 2020-03-07
10:10
Kagawa National Institute of Technology, Kagawa Collage
(Cancelled but technical report was issued)
A Program Visualization System that Considers the Design Patterns Forming Data Structure
Masanori Ohshiro, Yasuo Nagai (TUIS) ET2019-96
As a basis of class design utilizing object orientation, methods of forming data structures such as a list structure and... [more] ET2019-96
pp.115-119
KBSE 2020-03-06
14:45
Okinawa Tenbusu-Naha
(Cancelled but technical report was issued)
Effective Planing for AI/Data Analysis Projects Based on Goal-Oriented Requirements Analysis
Daisuke Okuya, Satoshi Ikada (OKI), Hiroyuki Nakagawa (Osaka Univ.) KBSE2019-49
Recently, the opportunities for AI and data analysis to be applied to social implementation beyond research subjects are... [more] KBSE2019-49
pp.19-24
HWS, VLD [detail] 2020-03-04
16:00
Okinawa Okinawa Ken Seinen Kaikan
(Cancelled but technical report was issued)
Pixel-based Mask Optimization with Lagrangian Relaxation and Boundary Flipping
Rina Azuma, Yukihide Kohira (Univ. of Aizu), Tomomi Matsui, Atsushi Takahashi (Tokyo Tech), Chikaaki Kodama (KIOXIA) VLD2019-105 HWS2019-78
Due to miniaturization of process technology, progressing manufacturing process by optical lithography is required. In r... [more] VLD2019-105 HWS2019-78
pp.65-70
HCGSYMPO
(2nd)
2019-12-11
- 2019-12-13
Hiroshima Hiroshima-ken Joho Plaza (Hiroshima) Visualization of conceptual model of cooking workspace
Ryutaro Hama, Azusa Saito, Yukari Takaku (LIXIL), Atsushi Hashimoto (Omron Sinic X)
This paper proposes a method for visualizing and analyzing conceptual models of cooking space in kitchen.
We hypothesi... [more]

ET 2019-03-15
10:40
Tokushima Naruto University of Education Program visualization system aware of the basic structure of design pattern.
Masanori Ohshiro, Yasuo Nagai (TUIS) ET2018-87
In advanced object - oriented programming education, it is important to understand the basic structure using object - or... [more] ET2018-87
pp.1-5
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2018-12-07
14:10
Hiroshima Satellite Campus Hiroshima Process Variation-aware Model-based OPC using 0-1 Quadratic Programming
Rina Azuma, Yukihide Kohira (Univ. of Aizu), Tomomi Matsui, Atsushi Takahashi (Tokyo Tech), Chikaaki Kodama, Shigeki Nojima (TMC) VLD2018-70 DC2018-56
Due to continuous shrinking of Critical Dimensions (CD) of layout pattern in VLSI, advances of manufacturing process in ... [more] VLD2018-70 DC2018-56
pp.209-214
EMCJ, IEE-EMC, IEE-MAG 2018-11-22
15:10
Overseas KAIST [Poster Presentation] Signal Integrity Analysis for High-speed Memory Test Interface using Data Capture PCB
Hyesoo Kim, Kyungjun Cho, Seongguk Kim, Joungho Kim (KAIST) EMCJ2018-80
In this paper, in high-speed graphic memory test interface, the trade-off relationship for electrical characteristic of ... [more] EMCJ2018-80
p.63
VLD, IPSJ-SLDM 2018-05-16
15:50
Fukuoka Kitakyushu International Conference Center Pixel-based OPC using Quadratic Programming for Mask Optimization
Rina Azuma, Yukihide Kohira (Univ. of Aizu) VLD2018-3
Due to continuous shrinking of Critical Dimensions (CD) in semiconductor manufacturing, advance of process technology in... [more] VLD2018-3
pp.31-36
AP 2018-04-19
15:00
Tokyo Hachijomachi-Shokokai [Tutorial Lecture] Microstrip antennas for multiband designs and reconfigurable techniques
Yuichi Kimura (Saitama Univ.) AP2018-3
Microstrip antennas are widely used for numerous applications such as wireless communications, broadcasting services, an... [more] AP2018-3
pp.13-18
ICD, MW 2018-03-01
13:00
Shiga The University of Shiga Prefecture [Special Talk] Realization of Elliptic Function Low-Pass Filter with High Attenuation -- Strategies for High Attenuation using Enclosure Structured by Electromagnetic Shielded Walls --
Tatsuya Yokoyama, Satoshi Ono, Koji Wada (UEC) MW2017-176 ICD2017-100
The Low-pass Filter(LPF) characteristics having low insersion loss in the passband and high attenuation in the stopband ... [more] MW2017-176 ICD2017-100
pp.15-20
KBSE 2018-03-02
11:10
Okinawa   Identification of Aggregation Roots and Providing Monotonous Views by Applying Existence Dependency Analysis to the Business Fulfilments
Akio Ida, Shigeo Kaneda, Yusuke Morimoto, Liu Xiangtao (Doshisha Unic.) KBSE2017-56
Many of the conventional methods combine the attributes of entities in an ad hoc manner to acquire View. In some cases, ... [more] KBSE2017-56
pp.103-108
CS, IE, IPSJ-AVM, ITE-BCT [detail] 2017-12-01
09:30
Aichi Nagoya University [Invited Talk] High-Performance Computing Programming for Image Processing Based on Computer Architecture
Norishige Fukushima (NIT) CS2017-72 IE2017-87
In this report, we review a parallelized and vectorized programming for high performance image processing and its design... [more] CS2017-72 IE2017-87
pp.73-78
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2017-11-06
15:20
Kumamoto Kumamoto-Kenminkouryukan Parea A Test Register Assignment Method to Reduce the Number of Test Patterns at Register Transfer Level Using Controller Augmentation
Shun Takeda, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyoto Sangyo Univ) VLD2017-37 DC2017-43
Recently, it is very important to reduce the number of test patterns by using design-for-testability (DFT) with the incr... [more] VLD2017-37 DC2017-43
pp.61-66
DC 2017-02-21
10:55
Tokyo Kikai-Shinko-Kaikan Bldg. IR-Drop Analysis on Different Power Supply Network Designs
Kohei Miyase, Kiichi Hamasaki (Kyutech), Matthias Sauer (University of Freiburg), Ilia Polian (University of Passau), Bernd Becker (University of Freiburg), Xiaoqing Wen, Seiji kajihara (Kyutech) DC2016-75
The shrinking feature size and low power design of LSI make LSI testing very difficult. Further development of LSI techn... [more] DC2016-75
pp.7-10
KBSE 2016-05-27
10:45
Tokyo Doshisha Univ. Tokyo Branch Office Model Checking of Source Code Based on Design Pattern
Yoshitaka Aoki (NUL) KBSE2016-6
We have proposed the " Discovery of Inconsistency of Behavior of System in Source Code between Specification using Model... [more] KBSE2016-6
pp.31-36
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2015-12-03
15:00
Nagasaki Nagasaki Kinro Fukushi Kaikan Easily-testable Carry Select Adder with Online Error Detection Capability
Nobutaka Kito (Chukyo Univ.) VLD2015-72 DC2015-68
An easily testable multi-block carry select adder with online error detection capability is proposed. An easily testable... [more] VLD2015-72 DC2015-68
pp.225-230
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