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Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD 2012-12-18
13:30		 Tokyo Tokyo Tech Front [Invited Talk] CMOS analog mixed circuit and its applications
Shouhei Kousai (Toshiba) ICD2012-118		 Recent CMOS Analog VLSI has evolved with CMOS Digital circuits and has been enabled various and ubiquitous applications.... [more] ICD2012-118
pp.115-120
ICD, ITE-IST 2010-07-22
14:00		 Osaka Josho Gakuen Osaka Center [Invited Talk] Digitally-Assisted Analog Test Technology -- Analog Circuit Test Technology in Nano-CMOS Era --
Haruo Kobayashi, Takahiro J. Yamaguchi (Gunma Univ.) ICD2010-27		 This paper reviews current production testing issues for analog and
mixed-signal SoC, and discusses the following:
(i)... [more]		 ICD2010-27
pp.37-42
ICD 2009-12-15
15:10		 Shizuoka Shizuoka University (Hamamatsu) Non-binary SAR ADC with Digital Compensation of Comparator Offset Effect
Tomohiko Ogawa (Gunma Univ), Tatsuji Mtsuura (Renesas), Haruo Kobayashi, Nobukazu Takai (Gunma Univ), Masao Hotta, Hao San (Tokyo City Univ) ICD2009-101		 This paper describes techniques for creating a low-power SAR ADC with an error-correcting non-binary successive approxim... [more] ICD2009-101
pp.139-144
ICD, ITE-IST 2009-10-02
12:15		 Tokyo CIC Tokyo (Tamachi) Digital Correction Algorithm of Timing Skew Effects in Time-Interleave ADC Systems
Koji Asami (Advantest), Tsuyoshi Kurosawa, Takenori Tateiwa, Hiroyuki Miyajima, Haruo Kobayashi (Gunma Univ.) ICD2009-52		 This paper describes a new method to compensate for the timing skew effects in time-interleaved ADC systems. The propose... [more] ICD2009-52
pp.105-110
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