Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
MSS, SS |
2019-01-16 10:50 |
Okinawa |
|
Design of distribution ratio on a multi-stage parallel production line based on an optimal velocity traffic model Toru Sano, Keiji Konishi (Osaka Pref. Univ.), Takehiro Itou, Hisaya Wakayama (NEC) MSS2018-70 SS2018-41 |
Recently, there is a need to implement production systems which can adapt to changing demand. This report proposes a mul... [more] |
MSS2018-70 SS2018-41 pp.85-90 |
EMCJ |
2018-07-27 15:45 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A study on measuring method of influence of contact force of contact points on signal transmission characteristics Kenji Aihara (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2018-32 |
When a contact point of a connector connecting electric devices has poor maintenance or degradation over time, it causes... [more] |
EMCJ2018-32 pp.61-66 |
EMD, R |
2017-02-17 15:10 |
Shiga |
Omuron Kusatsu Factory |
R2016-66 EMD2016-93 |
Railway application standards specify four different reliability parameters which are “Reliability”, “Availability”, “Ma... [more] |
R2016-66 EMD2016-93 pp.37-43 |
R |
2016-12-16 14:40 |
Kanagawa |
Maholoba Minds Miura (Miura City, Kanagawa Prefecture) |
IEC/TR 63039 Newly Published by IEC/TC56 for Probabilistic Risk Analysis Yoshinobu Sato (JACO) R2016-55 |
IEC TR 63039 provides the following guides from the perspective of risk analysis: a) defining the essential terms and co... [more] |
R2016-55 pp.7-12 |
IE, IMQ, MVE, CQ (Joint) [detail] |
2016-03-08 10:15 |
Okinawa |
|
Analysis of Failure Frequency Improvement for Telecommunications Networks Keita Kusanagi, Masahiro Hayashi (Tokyo City Univ.) CQ2015-138 |
This paper proposes a new index to clarify the percentage of number of failures at each element. We call this index ‘ele... [more] |
CQ2015-138 pp.171-176 |
AP (2nd) |
2016-02-29 14:20 |
Overseas |
Telecommunications University, Nha Trang, Vietnam |
A Proposal of Wireless Sensor Network System for Slope Failure Detection Using Smartphones Yafei Hou, Manato Fujimoto, Hirohiko Suwa, Yutaka Arakawa (NAIST), Julian Webber, Kazuto Yano, Satoshi Tsukamoto, Tomoaki Kumagai (ATR), Michinori Hatayama (Kyoto University) |
Due to frequency occurrence of Typhon and heavy rain and the increase of the landslide disaster, using wireless networks... [more] |
|
EMD |
2015-11-06 12:40 |
Miyagi |
Tohoku University, School of engineering, Aoba memorial hall |
Estimation of Inductance at Surface Structure in Contact Surfaces of Coaxial Connector Tomoya Sato (Tohoku Univ.), Yu-ichi Hayashi (Tohoku Gakuin Univ.), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMD2015-81 |
When a connector has contaminated surfaces or weak contact force, nonuniform current distribution between the real conta... [more] |
EMD2015-81 pp.77-82 |
CQ |
2015-07-07 11:35 |
Nara |
Nara Institute of Science and Technology |
A New Method of Approximation for Computing Failure Frequency of System Masahiro Hayashi (Tokyo City Univ.) CQ2015-35 |
An approximation method for computing the frequency of system failure is proposed. We took a conventional approximation ... [more] |
CQ2015-35 pp.81-86 |
EMD |
2013-11-16 10:30 |
Overseas |
Huazhong University of Science and Technology, Wuhan, P.R.China |
Investigation of Noise Interference due to Connector Contact Failure in a Coaxial Cable Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMD2013-82 |
Increased inductance values and contact resistance in connector contact surfaces due to degradation of connector contact... [more] |
EMD2013-82 pp.31-33 |
CQ, MoNA, IPSJ-DPS, IPSJ-GN, IPSJ-EIP (Joint) [detail] |
2013-09-12 10:10 |
Ishikawa |
Kanazawa Institute of Technology |
Time-specific Failure Frequency Analysis for Telecommunications Networks Tsubasa Kogami, Masahiro Hayashi (Tokyo City Univ.) CQ2013-32 |
This paper proposes a new approach to analyze time-specific failure frequency and time-specific success frequency for te... [more] |
CQ2013-32 pp.23-28 |
CQ |
2012-07-13 15:25 |
Ehime |
Ehime Univ. |
The Effect of Reliability on the Management index of Telecommunication Service Company Masahiro Hayashi (Tokyo City Univ.) CQ2012-40 |
This paper gives an extended approach of analyzing the effect of reliability on the management index of telecommunicatio... [more] |
CQ2012-40 pp.137-142 |
EMD, R |
2012-02-17 11:00 |
Kyoto |
|
An experimental study on contact resistance characteristics of relay contacts operated in the vicinity of a new acryl-based polymer Makoto Hasegawa, Nanae Kobayashi (Chitose Inst. of Science and Technology), Yoshiyuki Kohno, Hiroshi Ando (Kaneka Corp.) R2011-43 EMD2011-117 |
The authors have already reported that when relays were operated to break load currents in vapors evaporated from a newl... [more] |
R2011-43 EMD2011-117 pp.7-12 |
EMD |
2011-11-17 17:10 |
Akita |
Akita Univ. Tegata Campus |
Contact Resistance Characteristics of Relays Operated in Vapors Evaporated from Cured Polymeric Products Nanae Kobayashi, Makoto Hasegawa (Chitose Inst. of Science & Tech.), Yoshiyuki Kohno, Hiroshi Ando (Kaneka) EMD2011-85 |
The authors have already reported that when relays were operated to break load currents in vapors evaporated from an acr... [more] |
EMD2011-85 pp.97-102 |
CQ, MVE, IE (Joint) [detail] |
2011-03-08 16:35 |
Nagasaki |
Yasuragi IOUJIMA |
A Study of Reliability Measure for Telecommunications Networks Masahiro Hayashi (NTT Corp.) CQ2010-84 |
Unavailability, which is obtained by multiplying failure frequency (the mean number of outages per a unit time) & MTTR (... [more] |
CQ2010-84 pp.99-104 |
EMD, R |
2011-02-18 13:55 |
Shizuoka |
Shizuoka Univ. (Hamamatsu) |
An experimental study on contact resistance characteristics of relay contacts in evaporated vapor atmospheres Makoto Hasegawa, Nanae Kobayashi (Chitose. Inst. of Sci. & Tech.), Yoshiyuki Kohno (Kaneka) R2010-44 EMD2010-145 |
Influences of vapors evaporated from an acryl-based non-silicone-type polymeric cured product and conventional silicone-... [more] |
R2010-44 EMD2010-145 pp.13-18 |
EMD |
2010-11-11 14:30 |
Overseas |
Xi'an Jiaotong University |
An experimental study on contact resistance characteristics of relay contacts operated in the vicinity of polymer materials Nanae Kobayashi, Makoto Hasegawa (Chitose Inst. of Science and Tech.), Yoshiyuki Kohno (Kaneka) EMD2010-85 |
A commercially-available mechanical relay (AgSnIn contacts) was sealed into a can with a silicone-containing polymer mat... [more] |
EMD2010-85 pp.77-80 |
EMD |
2010-11-12 09:00 |
Overseas |
Xi'an Jiaotong University |
An Analysis of EM Radiation from Transmission Line with Loose Contact of Connector Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMD2010-99 |
Recently, for the electrical devices working at a high frequency bands, suppression of electromagnetic radiation field o... [more] |
EMD2010-99 pp.133-136 |
EMD, R |
2010-02-19 13:25 |
Osaka |
|
An experimental study on influences of silicone-type and non-silicone-type polymeric materials on contact resistance characteristics of relay contacts (III) Makoto Hasegawa (Chitose Inst. of Sci. and Tech.), Yoshiyuki Kohno (Kaneka Corp.) R2009-52 EMD2009-119 |
Influences of vapors evaporated from a newly-developed acryl-based polymeric material (containing no silicone components... [more] |
R2009-52 EMD2009-119 pp.13-18 |
ICD |
2009-12-14 10:50 |
Shizuoka |
Shizuoka University (Hamamatsu) |
[Invited Talk]
Experimental Evaluation Technique for Power Supply Noise and Logical Operation Failure Mitsuya Fukazawa (Renesas Technology Corp.), Makoto Nagata (Kobe Univ.) ICD2009-77 |
Logical operations in CMOS digital integration are highly prone to fail as the amount of power supply (PS) drop approach... [more] |
ICD2009-77 pp.7-12 |
EMD |
2009-11-20 11:20 |
Tokyo |
Nippon Institute of Technology, Kanda Campus, Tokyo, Japan |
Effect of Contact Point Distribution to the High-Frequency Impedance on a Coaxial Connector Yu-ichi Hayashi (Tohoku Univ.), Songping Wu, Jun Fan (Missouri Univ. of Sci. and Tech.), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMD2009-94 |
In this paper, we investigate an equivalent circuit for estimating connector contact failure, which saves computation re... [more] |
EMD2009-94 pp.109-112 |