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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
DC |
2020-02-26 11:35 |
Tokyo |
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Method for Inserting Fault-Detection-Strengthened Test Point under Multi-cycle Testing Tomoki Aono, Norihiro Nakaoka, Shyu Saikou, Wang Senling, Higami Yoshinobu, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Youichi Maeda, Jun Matsushima (Renesas) DC2019-89 |
For guaranteeing the functional safety of an in-vehicle system, a power-on self-test (POST) is required to test the devi... [more] |
DC2019-89 pp.19-24 |
SSS |
2019-12-17 13:35 |
Tokyo |
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Development of Functional Safety Design Method for High-speed Communication in Autonomous Car Nozomi Watanabe, Kenichi Shimbo, Tadanobu Toba (Hitachi, Ltd.) SSS2019-23 |
Along with the improvement of autonomous driving level, a number of Functional Safety (FuSa) elements has increased and ... [more] |
SSS2019-23 pp.5-8 |
SDM, ICD, ITE-IST [detail] |
2019-08-09 10:50 |
Hokkaido |
Hokkaido Univ., Graduate School /Faculty of Information Science and |
[Invited Talk]
A 28nm 600MHz Automotive Flash Microcontroller with Virtualization-Assisted Processor for Next-Generation Automotive Architecture supporting ISO26262 ASIL-D Naoto Okumura, Sugako Otani, Norimasa Otsuki, Yasufumi Suzuki, Shohei Maeda, Tomonori Yanagita, Takao Koike, Masao Ito, Minoru Uemura, Yasuhisa Shimazaki, Toshihiro Hattori, Noriaki Sakamoto, Hiroyuki Kondo (Renesas Electronics Corp.) SDM2019-47 ICD2019-12 |
Along with the rapid progress of automotive Electrical/Electronic(E/E) architecture, further integration of multiple ele... [more] |
SDM2019-47 ICD2019-12 pp.67-71 |
DC |
2019-02-27 14:05 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
FF Toggle Control Point Selection Methods for Fault Detection Enhancement under Multi-cycle Testing Tomoki Aono, Hanan T.Al-Awadhi, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) DC2018-79 |
Multi-cycle Test is a promising way to reduce the test volume of Logic-BIST (Logic Built-in Self-Test) based POST (Power... [more] |
DC2018-79 pp.49-54 |
SSS |
2017-12-19 15:05 |
Tokyo |
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System development approach for automative functional safety with GSN requirement modeling Masayuki Katai, Yuji Hirao (Nagaoka Univ. of Tech.) SSS2017-28 |
ISO26262 for the functional safety of the automotive has been issued in Nov. 2011 and been gradually established. The sa... [more] |
SSS2017-28 pp.13-16 |
ICD, SDM, ITE-IST [detail] |
2016-08-03 13:20 |
Osaka |
Central Electric Club |
[Invited Talk]
A 16nm FinFET Heterogeneous Nona-Core SoC Supporting Functional Safety Standard ISO26262 ASIL B Chikafumi Takahashi, Shinichi Shibahara, Kazuki Fukuoka, Jun Matsushima, Yuko Kitaji (Renesas System Design), Yasuhisa Shimazaki, Hirotaka Hara, Takahiro Irita (Renesas Electronics) SDM2016-64 ICD2016-32 |
This paper presents an SoC for the next generation of car infotainment, achieving high performance powered by nine heter... [more] |
SDM2016-64 ICD2016-32 pp.105-110 |
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