Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
DC |
2020-12-11 13:00 |
Hyogo |
(Primary: On-site, Secondary: Online) |
A Degradation Prediction of Circuit Delay Using A Gradient Descent Method Seiichirou Mori, Masayuki Gondou, Yousuke Miyake, Takaaki Kato, Seiji Kajihara (Kyutech) DC2020-59 |
As the risk of aging-induced faults of VLSIs is increasing, highly reliable systems require to predict when the aging-in... [more] |
DC2020-59 pp.1-6 |
DC |
2019-12-20 16:30 |
Wakayama |
|
Aging Observation using On-Chip Delay Measurement in Long-term Reliability Test Yousuke Miyake, Takaaki Kato, Seiji Kajihara (Kyutech), Masao Aso, Haruji Futami, Satoshi Matsunaga (Syswave), Yukiya Miura (TMU) DC2019-85 |
Avoidance of delay-related faults due to aging phenomena is an important issue of VLSI systems. Periodical delay measure... [more] |
DC2019-85 pp.37-42 |
PRMU, IPSJ-CVIM, MVE [detail] |
2017-01-19 18:35 |
Kyoto |
|
Reliability Evaluation of R-R Interval Measurement Status using the Electric Potential Characteristics of QRS Complex for Wearable ECG Devices Kana Eguchi, Ryosuke Aoki, Kazuhiro Yoshida, Tomohiro Yamada (NTT) PRMU2016-140 MVE2016-31 |
Electrocardiogram (ECG) captured by wearable ECG devices easily contains artifact because of the measurement faults. Sin... [more] |
PRMU2016-140 MVE2016-31 pp.171-176 |
OCS, NS, PN (Joint) |
2016-06-23 09:00 |
Hokkaido |
Hokkaido University |
Low Load Flow Quality Measurement for Data Center Network Tatsuya Fukuda, Yusuke Shinohara, Shinjiro Yagi (NEC) NS2016-29 |
It is important for data center operators to monitor their network and ensuring that the network work f... [more] |
NS2016-29 pp.7-12 |
DC, CPSY |
2013-04-26 16:40 |
Tokyo |
|
On-Chip Delay Measurement Using Adjacent Test Architecture Kentaroh Katoh (TNCT) CPSY2013-8 DC2013-8 |
This paper proposes an on-chip delay measurement using adjacent test architecture with TDC (Time to Digital Converter). ... [more] |
CPSY2013-8 DC2013-8 pp.43-48 |
OFT |
2012-10-26 09:50 |
Yamaguchi |
KAIKYO MESSE SHIMONOSEKI |
Individual Distribution Measurement in 32-branched PON Using Pulsed-Pump-Probe Brillouin Gain Analysis Hiroshi Takahashi, Xinyu Fan, Fumihiko Ito (NTT) OFT2012-42 |
A fault location technique for PONs is essential for improving the service reliability of optical fiber networks. OTDR i... [more] |
OFT2012-42 pp.51-54 |
OPE, OFT |
2012-03-02 10:55 |
Tokyo |
|
Individual Distribution Measurement in PON Using Pulsed-Pump-Probe Brillouin Gain Analysis Hiroshi Takahashi, Xinyu Fan, Yusuke Koshikiya, Fumihiko Ito (NTT) OFT2011-76 OPE2011-202 |
A fault location technique for PONs is essential for improving the service reliability of optical fiber networks. OTDR i... [more] |
OFT2011-76 OPE2011-202 pp.19-22 |
DC |
2010-02-15 13:20 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Reduction of execution times and areas for delay measurement by subtraction Toru Tanabe, Hirohisa Minato, Kentaroh Katoh, Kazuteru Namba, Hideo Ito (Chiba Univ.) DC2009-71 |
Since VLSI is in nanoscase size, high density and high speed in recent years, small-delay defects which change propagati... [more] |
DC2009-71 pp.39-44 |
NS, IN |
2005-03-03 08:40 |
Okinawa |
Okinawa Zanpa-misaki Royal |
Effectiveness of Address Selection Mechanism for Site Multihoming Yasunori Noumi, Takeshi Ikenaga (KIT), Yoshiaki Hori (Kyushu Univ.), Yuji Oie (KIT) |
A multihomed stub site is a stub site that has two or more connection to the Internet service providers. Multihoming pr... [more] |
NS2004-212 IN2004-212 pp.73-78 |