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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
DC |
2021-02-05 14:00 |
Online |
Online |
Multiple Target Test Generation Method using Test Scheduling Information of RTL Hardware Elements Ryuki Asami, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyoto Sangyo Univ), Masayuki Arai (Nihon Univ) DC2020-74 |
In recent years, since the test cost for large-scale integrated circuits has increased, design-for-testability methods f... [more] |
DC2020-74 pp.30-35 |
CPSY, DC, IPSJ-ARC [detail] |
2020-07-31 15:45 |
Online |
Online |
A Multiple Target Test Generation Method for Gate-Exhaustive Faults to Reduce the number of Test Patterns Ryuki Asami, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.), Masayuki Arai (Nihon Univ.) CPSY2020-12 DC2020-12 |
In recent years, as the high density and complexity of integrated circuits have increased, defects in cells have increas... [more] |
CPSY2020-12 DC2020-12 pp.75-80 |
HWS, VLD [detail] |
2020-03-06 14:30 |
Okinawa |
Okinawa Ken Seinen Kaikan (Cancelled but technical report was issued) |
A Test Generation Method for Resistive Open Faults Using Partial MAX-SAT solver Hiroshi Yamazaki, Yuta Ishiyama, Tatsuma Matsuta, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.), Masayuki Arai (Nihon Univ.), Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.) VLD2019-131 HWS2019-104 |
In VLSI testing, stuck-at fault model and transition fault model have been widely used. However, with advance of semicon... [more] |
VLD2019-131 HWS2019-104 pp.215-220 |
DC |
2020-02-26 14:10 |
Tokyo |
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A Don’t Care Identification-Filling Co-Optimization Method for Low Power Testing Using Partial Max-SAT Kenichiro Misawa, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyouto Sangyo Univ), Masayuki Arai (Nihon Univ) DC2019-92 |
Recently, in at-speed scan testing, excessive capture power dissipation is a serious problem. Low capture power test gen... [more] |
DC2019-92 pp.37-42 |
MSS, SS |
2015-01-27 09:20 |
Tottori |
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A supervisor synthesis by MaxSAT solvers under partial observation Tatsuki Hirota, Shoji Yuen (Nagoya Univ), Tetsuya Tohdo (DENSO) MSS2014-82 SS2014-46 |
Synthesis of the supervisor for discrete event systems under partial observation has been shown exponen-
tial in princi... [more] |
MSS2014-82 SS2014-46 pp.79-84 |
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