Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
CPM |
2021-03-03 14:00 |
Online |
Online |
Ferromagnetic Single-Electron Devices Comprising Co Nanoparticles Assembled by Use of On-Chip Electromagnets Kenta Fujikura, Tetsuya Urae, Kazuma Sekine, Masataka Moriya, Hiroshi Shimada (UEC), Ayumi Hirano-Iwata (TU), Fumihiko Hirose (YU), Yoshinao Mizugaki (UEC) CPM2020-70 |
In this research, cobalt nanoparticles, which are ferromagnets, were assembled in a nanogap by magnetic field alignment ... [more] |
CPM2020-70 pp.55-58 |
EMD |
2015-11-05 16:25 |
Miyagi |
Tohoku University, School of engineering, Aoba memorial hall |
Behavior of Terminal Resistance and Deterioration Prediction of Terminal Resistance with Connectors Used in Long Driven Vehicles Shigeru Sawada, Atsushi Shimizu, Yasushi Saitoh (ANtech) EMD2015-72 |
It is an important issue to investigate the deterioration state of connectors used in long driven vehicles in order to d... [more] |
EMD2015-72 pp.29-34 |
ICM |
2015-03-20 14:00 |
Okinawa |
Ishigaki-City-Hall |
An experimental evaluation of the wide-area distributed storage using Software Defined Disaster Emulation (SDDE) Platform Yoshiaki Kitaguchi (Kanazawa Univ.), Kazuma Nishiuchi (City Net Inc.), Tohru Kondo (Hiroshima Univ.), Kohei Ichikawa (NAIST), Hiroki Kashiwazaki, Ikuo Nakagawa (Osaka Univ.), Yutaka Kikuchi (KIT) ICM2014-70 |
In the wide-area distributed systems such as the Internet, it is important to ensure the robustness and the availability... [more] |
ICM2014-70 pp.97-102 |
EMD, R |
2014-02-21 14:30 |
Osaka |
|
Effect of self-magnetic field on current flowing through true contact area Terutaka Tamai (Elcontech), Shigeru Sawada, Yasuhiro Hattori (AutoNetworks) R2013-87 EMD2013-143 |
As size of true contact are in contact interface is very small comparing apparent area, the current which flow the true ... [more] |
R2013-87 EMD2013-143 pp.19-24 |
EMCJ, EMD |
2013-07-12 10:35 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Degradation Phenomenon of Electrical Contacts using a Hammering Oscillation Mechanism or a Micro-Sliding Mechanism
-- A fundamental study on the performance of the hammering oscillation mechanism (28) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMCJ2013-39 EMD2013-24 |
Authors have studied the effect on electrical contacts by actual micro-oscillation using the hammering oscillation mecha... [more] |
EMCJ2013-39 EMD2013-24 pp.1-6 |
EMD, R |
2013-02-15 13:35 |
Mie |
Sumitomo Wiring System, Ltd |
Visualization of electric current in contact and effect of thin film on contact resistance Shigeru Sawada, Shigeki Tsukiji (Mie Univ.), Shigeki Shimada (Sumitomo Electric Industries), Terutaka Tamai (Elcontech), Yasuhiro Hattori (ANTech) R2012-72 EMD2012-103 |
The mathematical solutions and electrical field analysis results of current density distribution in electric contact hav... [more] |
R2012-72 EMD2012-103 pp.1-6 |
EMD |
2012-12-21 15:45 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Degradation Phenomenon of Electrical Contacts using hammering oscillating mechanism and micro-sliding mechanism
-- A fundamental study on the performance of the hammering oscillating mechanism (26) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling (TMC), Naoki Masuda (TCT), Kunio Yanagi, Hiroaki Kubota (TMC), Masashi Terasaki (TCT), Koichiro Sawa (NIT) EMD2012-95 |
Authors have studied the influence on electrical contacts by actual micro-oscillation using some oscillating mechanisms ... [more] |
EMD2012-95 pp.27-32 |
EMD |
2012-12-01 14:50 |
Chiba |
Chiba Institute of Technology |
Effect of Current Load on Fretting of Au-plated contacts Wanbin Ren, Peng Wang, Shengjun Xue (Harbin Inst. of Tech.) EMD2012-87 |
The fretting corrosion behavior of Au-plated contacts is studied at various current loads of 10, 100, 500 and 1000mA. Th... [more] |
EMD2012-87 pp.133-140 |
EMCJ, EMD |
2012-07-20 12:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism
-- A fundamental study on the performance of the oscillating mechanism (23) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Kouki Takeda, Naoki Masuda, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMCJ2012-41 EMD2012-16 |
Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] |
EMCJ2012-41 EMD2012-16 pp.1-6 |
EMD, CPM, OME |
2012-06-22 17:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism
-- A fundamental study on the performance of the oscillating mechanism(22) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2012-15 CPM2012-32 OME2012-39 |
Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] |
EMD2012-15 CPM2012-32 OME2012-39 pp.41-46 |
EMD |
2011-11-17 14:40 |
Akita |
Akita Univ. Tegata Campus |
Dependence of Contact Resistance Distribution on Circuit Current after Occurrence of Break Arcs Youhei Yamanashi, Katsuyoshi Miyaji, Junya Sekikawa, Takayoshi Kubono (Shizuoka Univ.) EMD2011-79 |
Break arcs are generated in a DC48V and 1-6A resistive circuit. Contact surface that is exposed by the break arc, the co... [more] |
EMD2011-79 pp.67-72 |
EMD |
2011-11-18 08:45 |
Akita |
Akita Univ. Tegata Campus |
Current Density Analysis in Contact Area by Using Light Emission Diode Wafer Shigeru Sawada, Shigeki Tsukiji (Mie Univ.), Terutaka Tamai (ElconTech Consulting), Yasuhiro Hattori (Autonetworks Lab.) EMD2011-88 |
In order to clarify the theory of contact resistance, there are many reports in these years. Mathematically the
constri... [more] |
EMD2011-88 pp.115-119 |
EMD |
2011-11-18 09:25 |
Akita |
Akita Univ. Tegata Campus |
Deformation of Crystal Morphology in Tin Plated Contact Layer caused by Loading Terutaka Tamai (Elcontech Consulting), Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (AutoNetworks Lab.) EMD2011-90 |
Tin (Sn) plated contacts are widely applied to connector contacts in aut
omotive industries. Surfaces of plated tin are... [more] |
EMD2011-90 pp.127-132 |
EMCJ |
2011-09-12 14:45 |
Hokkaido |
Hokkaido Univ. |
Estimation of Internal Human Body Resistances for Low Frequency Using Various Human Models
-- Relation with BMI -- Hiroki Shinohara, Yosuke Nakayama, Hiroo Tarao (Kagawa NCT), Isao Hamamoto, Noriyuki Hayashi (Miyazaki Univ) EMCJ2011-75 |
In order to assess electrical safety issues, internal body resistances and equipotential distributions at power frequenc... [more] |
EMCJ2011-75 pp.21-26 |
NC, MBE (Joint) |
2011-03-09 11:05 |
Tokyo |
Tamagawa University |
Estimating the distribution of the dendritic membrane resistance with the line process Jun Kitazono (The Univ. of Tokyo), Toshiaki Omori (The Univ. of Tokyo/RIKEN), Toru Aonishi (Tokyo Tech/RIKEN), Masato Okada (The Univ. of Tokyo/RIKEN) NC2010-185 |
Statistical methods for estimating dendritic membrane properties,
including membrane resistance as a representative ex... [more] |
NC2010-185 pp.343-348 |
EMD |
2011-01-28 13:50 |
Tokyo |
Japan Aviation Electronics Industry,Limited |
Measurement of Contact Resistance Distribution in Fretting Corrosion Track for the Tin Plated Contacts Soushi Masui, Shigeru Sawada, Terutaka Tamai (Mie Univ), Yasuhiro Hattori (AN-Tech), Kazuo Iida (Mie Univ) EMD2010-137 |
It is observed that contact resistance for tin plated contact in automotive connectors increased due to fretting corrosi... [more] |
EMD2010-137 pp.11-16 |
EMD |
2010-11-12 14:00 |
Overseas |
Xi'an Jiaotong University |
Research onTemperature Rise and Surface Deformation of Electrical Contacts by FEM Hiroki Ryobuchi, Koichiro Sawa, Noboru Morita, Takefumi Hiraguri, Kenya Jin'no, Takahiro Ueno (Nippon Inst. of Tech.) EMD2010-114 |
Recently, sliding contact mechanisms are being used to supply current to rotating or moving objects in a number of indus... [more] |
EMD2010-114 pp.197-200 |
EMCJ, EMD |
2010-07-16 13:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A study of W based composite materials containing solid lubricants for sliding contacts Yoshitada Watanabe, Masaomi Arai (Kogakuin Univ.) EMCJ2010-35 EMD2010-20 |
Sliding scars of the three kinds of W systems composite materials containing solid lubricants have been studied by the t... [more] |
EMCJ2010-35 EMD2010-20 pp.19-24 |
ED, MW |
2010-01-14 10:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg |
Deviation from Proportional Relationship Between Emitter Charging Time and Inverse Current of Heterojunction Bipolar Transistors Operating at High Current Density Masayuki Yamada, Takafumi Uesawa, Yasuyuki Miyamoto, Kazuhito Furuya (Tokyo Inst. of Tech.) ED2009-182 MW2009-165 |
We investigated the relationship between the emitter charging time and inverse current of heterojunction bipolar transis... [more] |
ED2009-182 MW2009-165 pp.43-48 |
EMD |
2009-11-19 09:50 |
Tokyo |
Nippon Institute of Technology, Kanda Campus, Tokyo, Japan |
Experimental Result on Reducing the Resistance Due To Temperature Rise in Pd Contacts Hiroyuki Ishida, Shunsuke Sasaki (Tohoku Bunka Gakuen Univ.) EMD2009-71 |
We should study on the phenomenon reducing the contact resistance. Contact voltages in Palladium (Pd) contacts, temperat... [more] |
EMD2009-71 pp.9-12 |